Results 121 to 130 of about 10,323 (170)

Fault injection analysis of transient faults in clustered VLIW processors

14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2011
VLIW architectures are widely employed in several embedded signal applications mainly because they offer the opportunity to gain high computational performances while maintaining reduced clock rate and power consumption. Recently, VLIW processors became more and more suitable to be employed in various embedded processing systems including safety ...
STERPONE, Luca, SABENA, DAVIDE, CAMPAGNA, SALVATORE, SONZA REORDA, Matteo   +3 more
openaire   +2 more sources

Logic Circuits Testing for Transient Faults

European Test Symposium (ETS'05), 2005
Transient faults are becoming an increasingly serious concern for logic circuits. They can be caused by thermal neutrons, present at all altitudes, and by other types of ionizing radiation, especially in aerospace applications and nuclear engineering. In this paper we examine issues related to detection of transient errors.
Smita Krishnaswamy, Igor L. Markov, John P. Hayes   +2 more
openaire   +1 more source

On system diagnosis for transient fault situations

Microprocessing and Microprogramming, 1988
The paper deals with the problem of diagnosability of one-step t-diagnosable systems for transient fault situations. Test invalidation problem is discussed and assumptions corresponding to transient fault situations are stated. Necessary and sufficient condition for one-step t-fault diagnosability of maximum connection assignment is presented.
Franc Novak, Sandi Klavzar, Ludvik Gyergyek   +2 more
openaire   +1 more source

Transient Fault Detection in State-Automata

2nd International Conference on Dependability of Computer Systems (DepCoS-RELCOMEX '07), 2007
State automata are implemented in numerous ways and technologies - from simple traffic light controls to high-performance microprocessors comprising thousands of different states. Highly-integrated microprocessors get more and more susceptible to transient faults induced by radiation, extreme clocking, temperature and decreasing voltage supplies.
Bernhard Fechner, Andre Osterloh
openaire   +1 more source

Diagnosis of Transient Faults in Quantised Systems

IFAC Proceedings Volumes, 2000
Abstract This paper concerns the diagnosis and identification of faults that occur in systems where signals can only be measured through a quantiser. A qualitative model is used that represents the discrete-event behaviour of the quantised system. Three different diagnostic algorithms are presented for determining the fault probabilities, the first ...
F. Schiller, J. Schröder, J. Lunze
openaire   +1 more source

Transient fault analysis of CORDIC processor

2012 19th IEEE International Conference on Electronics, Circuits, and Systems (ICECS 2012), 2012
In this paper, we propose a method to evaluate the impact of a transient fault in CORDIC processors. The proposed approach takes into account the spatial and temporal localization of the fault. It also embeds the probability that such a fault occurs. By defining a fault impact coefficient, it is possible to identify the most critical arithmetic blocks ...
Ting An, Matteo Causo, Lirida Alves de Barros Naviner, Philippe Matherat   +3 more
openaire   +1 more source

Device-level transient fault modeling

Proceedings of IEEE 24th International Symposium on Fault- Tolerant Computing, 2002
This paper examines the accuracy of a discrete logic-level fault model often assumed in gate-level or discrete timing simulation. The analysis is done by comparing the faulty behavior predicted by the discrete model to that predicted by a circuit-level SPICE model whose accuracy is generally accepted. The comparison is made at both the subcircuit level,
Gregory L. Ries, Gwan S. Choi, Ravishankar K. Iyer   +2 more
openaire   +1 more source

Transient Fault Tolerance for ccNUMA Architecture

2012 Sixth International Conference on Innovative Mobile and Internet Services in Ubiquitous Computing, 2012
Transient fault is a critical concern in the reliability of microprocessors system. The software fault tolerance is more flexible and lower cost than the hardware fault tolerance. And also, as architectural trends point toward multi core designs, there is substantial interest in adapting parallel and redundancy hardware resources for transient fault ...
Xingjun Zhang, Endong Wang, Feilong Tang 0001, Meishun Yang, Hengyi Wei, Xiaoshe Dong   +5 more
openaire   +1 more source

Autonomous transient fault emulation on FPGAs for accelerating fault grading

11th IEEE International On-Line Testing Symposium, 2005
Very deep submicron and nanometer technologies have increased notably integrated circuit (IC) sensitiveness to radiation. Soft errors are currently appearing into ICs working at earth surface. Therefore, hardened circuits are currently required in many applications where fault tolerance (FT) was not a requirement in the very near past.
Celia López-Ongil, Mario García-Valderas, Marta Portela-García, Luis Entrena-Arrontes   +3 more
openaire   +1 more source

Transient Fault Induction Attacks on XTR

2004
At Crypto 2000, the public-key system XTR was introduced by Lenstra and Verheul. This system uses an efficient and compact method to represent subgroup elements. Application of XTR in cryptographic protocols, such as Diffie-Hellman key agreement, El Gamal encryption or DSA signature, greatly reduces the computational cost without compromising security.
Mathieu Ciet, Christophe Giraud 0001
openaire   +1 more source