A multistage transfer learning framework for intelligent fault diagnosis of rotating machinery under variable operating conditions. [PDF]
Sci RepSiddique MF +4 more
europepmc +1 more source
IIoT-Based Remote Monitoring System for Temperature, Current, and Vibration Using PLC and Node-RED in a Data Center Cooling Compressor: A Condition-Based Maintenance Framework. [PDF]
Sensors (Basel)Pinza Apolo JD +5 more
europepmc +1 more source
A machine learning-based classification method for SynRM faults. [PDF]
Sci RepRajini V +6 more
europepmc +1 more source
Robust Incipient Fault Diagnosis of Rolling Element Bearings Under Small-Sample Conditions Using Refined Multiscale Rating Entropy. [PDF]
Entropy (Basel)Wu S, Liu H, Tao L.
europepmc +1 more source
Related searches:
zbMATH Open Web Interface contents unavailable due to conflicting licenses.
Joffroy Beauquier +3 more
openaire +1 more source
Combining Correction of Delay Faults and Transient Faults
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2015The on-going down-scaling of devices in microelectronics has resulted both in reliability problems and in problems regarding power dissipation. Even worse, reducing supply voltages below 1 V has resulted in problems due to inevitable parameter variations from production on one side and from parameter shifts by aging effects on the other hand.
Tobias Koal +2 more
openaire +1 more source
Tolerating transient faults in MARS
[1990] Digest of Papers. Fault-Tolerant Computing: 20th International Symposium, 2002The concepts of transient fault handling in the MARS architecture are discussed. After an overview of the MARS architecture, the mechanisms for the detection of transient faults are discussed in detail. In addition to extensive checks in the hardware and in the operating system, time-redundant execution of application tasks is proposed for the ...
Hermann Kopetz +4 more
openaire +1 more source
Conservatively Analyzing Transient Faults
2015 IEEE Computer Society Annual Symposium on VLSI, 2015Due to the decreasing size of transistors, the probability of transient errors and the variability of the transistor's characteristics in electrical circuits are continuously increasing. These issues demand for techniques to check the robustness of circuits and their behavior under transient faults and variability.
Niels Thole +2 more
openaire +1 more source
The effect of the transient faults in dependability prediction
Microprocessors and Microsystems, 2016Markov chain models are used to evaluate the dependability properties (reliability, safety, availability, maintainability etc.) of the mission-critical systems. Dependability models are often focused only on the basic stuck-at faults. On the other hand the transient faults are present in the operational environment but not included in the dependability
Martin Danhel +2 more
openaire +1 more source
Modeling of transient faults and fault-tolerant design in nanoelectronics
2013 IEEE 56th International Midwest Symposium on Circuits and Systems (MWSCAS), 2013Transistors in nanometric technologies are increasingly susceptible to faults due to physical limitations. Since the constituent gates of a logic circuit actually have different failure rates, the assumption of constant gate failure rate in existing reliability evaluation and fault tolerant design is not desirable.
Tian Ban +3 more
openaire +1 more source