Results 251 to 260 of about 147,033 (306)

Transient fault detectors

Distributed Computing, 2007
zbMATH Open Web Interface contents unavailable due to conflicting licenses.
Joffroy Beauquier   +3 more
openaire   +1 more source

Combining Correction of Delay Faults and Transient Faults

2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2015
The on-going down-scaling of devices in microelectronics has resulted both in reliability problems and in problems regarding power dissipation. Even worse, reducing supply voltages below 1 V has resulted in problems due to inevitable parameter variations from production on one side and from parameter shifts by aging effects on the other hand.
Tobias Koal   +2 more
openaire   +1 more source

Conservatively Analyzing Transient Faults

2015 IEEE Computer Society Annual Symposium on VLSI, 2015
Due to the decreasing size of transistors, the probability of transient errors and the variability of the transistor's characteristics in electrical circuits are continuously increasing. These issues demand for techniques to check the robustness of circuits and their behavior under transient faults and variability.
Niels Thole   +2 more
openaire   +1 more source

Tolerating transient faults in MARS

[1990] Digest of Papers. Fault-Tolerant Computing: 20th International Symposium, 2002
The concepts of transient fault handling in the MARS architecture are discussed. After an overview of the MARS architecture, the mechanisms for the detection of transient faults are discussed in detail. In addition to extensive checks in the hardware and in the operating system, time-redundant execution of application tasks is proposed for the ...
Hermann Kopetz   +4 more
openaire   +1 more source

The effect of the transient faults in dependability prediction

Microprocessors and Microsystems, 2016
Markov chain models are used to evaluate the dependability properties (reliability, safety, availability, maintainability etc.) of the mission-critical systems. Dependability models are often focused only on the basic stuck-at faults. On the other hand the transient faults are present in the operational environment but not included in the dependability
Martin Danhel   +2 more
openaire   +1 more source

Modeling of transient faults and fault-tolerant design in nanoelectronics

2013 IEEE 56th International Midwest Symposium on Circuits and Systems (MWSCAS), 2013
Transistors in nanometric technologies are increasingly susceptible to faults due to physical limitations. Since the constituent gates of a logic circuit actually have different failure rates, the assumption of constant gate failure rate in existing reliability evaluation and fault tolerant design is not desirable.
Tian Ban   +3 more
openaire   +1 more source

Fault injection analysis of transient faults in clustered VLIW processors

14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2011
VLIW architectures are widely employed in several embedded signal applications mainly because they offer the opportunity to gain high computational performances while maintaining reduced clock rate and power consumption. Recently, VLIW processors became more and more suitable to be employed in various embedded processing systems including safety ...
STERPONE, Luca   +3 more
openaire   +2 more sources

On system diagnosis for transient fault situations

Microprocessing and Microprogramming, 1988
The paper deals with the problem of diagnosability of one-step t-diagnosable systems for transient fault situations. Test invalidation problem is discussed and assumptions corresponding to transient fault situations are stated. Necessary and sufficient condition for one-step t-fault diagnosability of maximum connection assignment is presented.
Franc Novak   +2 more
openaire   +1 more source

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