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Properties of Eco-Friendly Cement Composites Made with Recycled Cement Mortar-Based Artificial Aggregates. [PDF]

Materials (Basel)
Kalinowska-Wichrowska K, Pawluczuk E, Granatyr K, Franus M, Kosior-Kazberuk M, Bołtryk M, Masłoń A.   +6 more
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Energy Dispersive X-ray Diffractometry

Advances in X-ray Analysis, 1976
This paper describes the principles, methods, instrumentation and results of EDXKD and a computer method of profile fitting to obtain corrected intensities and peak energies from isolated and overlapping reflections. The profile, P, of a diffraction peak is a convolution of the incident X-ray spectrum, X, the geometrical aberrations, T, the ...
Michael Mantler, William Parrish
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Synchrotron X-ray polycrystalline diffractometry

Journal of Applied Crystallography, 1986
Results using parallel-beam polycrystalline geometry at the Stanford Storage Ring are compared with conventional X-ray tube focusing. The PC-automated instrumentation included a pair of vertical-scan diffractometers for wavelength selection using a Si(111) channel monochromator and for powder specimens which may be measured in reflection or ...
W. Parrish, M. Hart, T. C. Huang
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Nano X-ray diffractometry device for nanofluidics

Lab on a Chip, 2018
Nanofluidics is gaining attention because it has unique liquid and fluidic properties that are not observed in microfluidics.
Kazuma Mawatari, Hiroki Koreeda, Koji Ohara, Shinji Kohara, Koji Yoshida, Toshio Yamaguchi, Takehiko Kitamori   +6 more
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Quantitative x-ray diffractometry

1970
Very often the quantity of a compound has to be determined in a complex mineral, the composition and absorption coefficients of which are unknown. To correct for these unknown facts, the attenuation of a diffraction line arising from the bottom of the sample holder may be used. The following intensities were collected in measuring the percentage quartz
R. Jenkins, J. L. de Vries
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X-Ray diffractometry of metamorphic nanoheterostructures

Crystallography Reports, 2014
Elastic strains in active regions of metamorphic transistor nanoheterostructures In0.7Al0.3As/In0.7Ga0.3As/In0.7Al0.3As on GaAs substrates with a metamorphic buffer (MB) having different complex designs have been determined by X-ray diffractometry. The objects of study are linear-graded MBs with different thicknesses, including those with internal ...
G. B. Galiev, S. S. Pushkarev, E. A. Klimov, P. P. Maltsev, R. M. Imamov, I. A. Subbotin   +5 more
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X-Ray Diffractometry of Radioactive Samples

Review of Scientific Instruments, 1955
Geiger counter x-ray diffractometer patterns of samples with moderate to high radioactivity give a high background, which reduces the precision of the x-ray-line intensity and profile measurements. The large amount of lead shielding required to reduce the background is not practical in modern precision goniometers and could not bring as great a ...
T. R. Kohler, William Parrish
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X-ray Diffractometry in Forensic Science

2022
X-ray Diffractometry is a very useful analytical technique to achieve detailed information about the crystal structure and mineralogical composition, qualitative and quantitative, of matter. It is a technique that exploits the interaction between solid matter and X-rays that, converged on a substance, are diffracted.
Piergiulio Cappelletti, Sossio Fabio Graziano, David L. Bish   +2 more
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Single-crystal X-ray diffractometry

1998
Abstract This chapter is devoted to experimental conditions and techniques for crystal structure data collection. First of all let us determine the type of task which should be carried out by the experimenter. What is an experiment in general?
L A Aslanov, G V Fetisov
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Fluorescent sources for X-ray diffractometry

Acta Crystallographica, 1958
Fluorescent radiat ion has been used for monochromatic X r a y sources since the very early days of X r a y analysis (Barkla, 1911). In recent years fluorescent sources have been used in a var ie ty of applications, such as absorpt iometry (EngstrSm, 1947), microrad iography (Rogers, 1952; Splettstosser & Seeman, 1952), and as wide-beam sources (Larson,
W. Parrish, K. Lowitzsch, N. Spielberg
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