Results 201 to 210 of about 32,038 (270)

Effect of Heat Treatment on In Vitro Cytotoxicity of Ti-Nb-Zr Gum Metal Alloy. [PDF]

Materials (Basel)
Etemad A, Hasani S, Mashreghi A, Heidari F, Salehikahrizsangi P, Schwarz S, Bloch K, Nabialek M.   +7 more
europepmc   +1 more source

Temperature-dependent dynamic disproportionation in LiNiO₂. [PDF]

Nat Commun
Poletayev AD, Green RJ, Swallow JEN, An L, Jones L, Harris G, Bencok P, Sutarto R, Cottom JP, Morgan BJ, House RA, Weatherup RS, Islam MS.   +12 more
europepmc   +1 more source

Terahertz spectroscopy for analysis of vaterite-to-calcite crystal phase transition induced by distilled water. [PDF]

PLoS One
Okada S, Kurahashi N, Tanida Y.
europepmc   +1 more source

Piezo-photocatalysis over high-nuclearity titanium-oxide cluster via lead heterocoordination enhances activity by piezoelectric effect. [PDF]

Sci Adv
Liu L, Zhang G, Ma J, Wang D, Wang J, Xuan L, Nie J, Wang G, Wang Y.   +8 more
europepmc   +1 more source

Performance characterization of x-ray crystal spectroscopy highly oriented pyrolytic graphite reflectors based on x-ray diffractometry experiments

Dian Lu, Zhifeng Cheng, Tian-Lei Zhao, Lingxiong Yuan, Lan Gao, Jonathan Klabacha, N. Pablant, R. Tieulent, Zichao Lin, Yifei Jin, Yu Fan, Jia Fu, Hongming Zhang, Bo Lyu, Fudi Wang   +14 more
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Mapping the Residual Stress Distribution in Polycrystalline Quartz Tiger's Eye Using Raman Spectroscopy. [PDF]

Small Methods
Kidman GC, Salamat A, Patterson BM, Hooks DE, Burnley PC.   +4 more
europepmc   +1 more source

Use of x-ray powder diffractometry in combination with SEM and microencapsulation for studying the physico-chemical transformations of crystalline particles on teflon filters

, 1986
Rafael Otto, J.M. Jaklevic
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Energy Dispersive X-ray Diffractometry

Advances in X-ray Analysis, 1976
This paper describes the principles, methods, instrumentation and results of EDXKD and a computer method of profile fitting to obtain corrected intensities and peak energies from isolated and overlapping reflections. The profile, P, of a diffraction peak is a convolution of the incident X-ray spectrum, X, the geometrical aberrations, T, the ...
Michael Mantler, William Parrish
openaire   +1 more source

Synchrotron X-ray polycrystalline diffractometry

Journal of Applied Crystallography, 1986
Results using parallel-beam polycrystalline geometry at the Stanford Storage Ring are compared with conventional X-ray tube focusing. The PC-automated instrumentation included a pair of vertical-scan diffractometers for wavelength selection using a Si(111) channel monochromator and for powder specimens which may be measured in reflection or ...
W. Parrish, M. Hart, T. C. Huang
openaire   +1 more source