Results 211 to 220 of about 32,038 (270)

Nano X-ray diffractometry device for nanofluidics

Lab on a Chip, 2018
Nanofluidics is gaining attention because it has unique liquid and fluidic properties that are not observed in microfluidics.
Kazuma Mawatari, Hiroki Koreeda, Koji Ohara, Shinji Kohara, Koji Yoshida, Toshio Yamaguchi, Takehiko Kitamori   +6 more
openaire   +2 more sources

Quantitative x-ray diffractometry

1970
Very often the quantity of a compound has to be determined in a complex mineral, the composition and absorption coefficients of which are unknown. To correct for these unknown facts, the attenuation of a diffraction line arising from the bottom of the sample holder may be used. The following intensities were collected in measuring the percentage quartz
R. Jenkins, J. L. de Vries
openaire   +1 more source

X-Ray diffractometry of metamorphic nanoheterostructures

Crystallography Reports, 2014
Elastic strains in active regions of metamorphic transistor nanoheterostructures In0.7Al0.3As/In0.7Ga0.3As/In0.7Al0.3As on GaAs substrates with a metamorphic buffer (MB) having different complex designs have been determined by X-ray diffractometry. The objects of study are linear-graded MBs with different thicknesses, including those with internal ...
G. B. Galiev, S. S. Pushkarev, E. A. Klimov, P. P. Maltsev, R. M. Imamov, I. A. Subbotin   +5 more
openaire   +1 more source

X-Ray Diffractometry of Radioactive Samples

Review of Scientific Instruments, 1955
Geiger counter x-ray diffractometer patterns of samples with moderate to high radioactivity give a high background, which reduces the precision of the x-ray-line intensity and profile measurements. The large amount of lead shielding required to reduce the background is not practical in modern precision goniometers and could not bring as great a ...
T. R. Kohler, William Parrish
openaire   +1 more source

X-ray Diffractometry in Forensic Science

2022
X-ray Diffractometry is a very useful analytical technique to achieve detailed information about the crystal structure and mineralogical composition, qualitative and quantitative, of matter. It is a technique that exploits the interaction between solid matter and X-rays that, converged on a substance, are diffracted.
Piergiulio Cappelletti, Sossio Fabio Graziano, David L. Bish   +2 more
openaire   +2 more sources

Single-crystal X-ray diffractometry

1998
Abstract This chapter is devoted to experimental conditions and techniques for crystal structure data collection. First of all let us determine the type of task which should be carried out by the experimenter. What is an experiment in general?
L A Aslanov, G V Fetisov
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Fluorescent sources for X-ray diffractometry

Acta Crystallographica, 1958
Fluorescent radiat ion has been used for monochromatic X r a y sources since the very early days of X r a y analysis (Barkla, 1911). In recent years fluorescent sources have been used in a var ie ty of applications, such as absorpt iometry (EngstrSm, 1947), microrad iography (Rogers, 1952; Splettstosser & Seeman, 1952), and as wide-beam sources (Larson,
W. Parrish, K. Lowitzsch, N. Spielberg
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Parallel-beam X-ray diffractometry using X-ray guide tubes

Journal of Applied Crystallography, 2000
A parallel-beam X-ray diffraction geometry using X-ray guide tubes is proposed to eliminate preferred-orientation effects in powder X-ray diffraction (XRD) patterns and for new applications of XRD. A bundle of X-ray guide tubes (polycapillaries) is used to provide an intense quasi-parallel (approximately 0.2° divergence) and large-diameter ...
Toyoko Yamanoi, Hiromoto Nakazawa
openaire   +1 more source

Escape Peaks in X-Ray Diffractometry

Advances in X-ray Analysis, 1964
AbstractEscape peaks occur when the incident X-ray quantum, energy exceeds the absorption edge energy of the detector element and the resulting X-ray fluorescence is lost from the detector. The most common escape peaks result from 1 K-fluorescence in NaI-scintillation counters and Xe K-, Xe L-, and Kr K-fluorescence in proportional counters.
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Particle statistics in X-ray diffractometry

1970
Only those crystallites having the reflecting planes almost parallel to the specimen surface can contribute to a certain reflection. The intensity of the resulting diffraction is thus dependent on this number of crystallites. Intensities of different diffraction lines or between different specimens can only be compared if the number of particles ...
R. Jenkins, J. L. de Vries
openaire   +1 more source