Results 231 to 240 of about 32,038 (270)

X-Ray Diffractometry with Slightly Absorbing Samples

Journal of Applied Physics, 1959
A method for measuring x-ray diffraction intensities of samples which are deeply penetrated, such as liquid and nitreous materials, is described. The sensitive angle of the detector is limited by a scatter slit which is focused on exactly the same area of the sample surface as is illuminated by the primary beam.
H. A. Levy, P. A. Agron, M. D. Danford
openaire   +1 more source

Compression Apparatus for Powder X-Ray Diffractometry

Review of Scientific Instruments, 1962
A compression apparatus has been constructed which is an integral part of a Norelco diffractometer shaft. The diffraction pattern of a sample can be obtained while it is under pressures up to 30 000 psi.
H. Steinfink, J. E. Gebhart
openaire   +1 more source

Advances in X-Ray Diffractometry of Clay Minerals

Clays and clay minerals (National Conference on Clays and Clay Minerals), 1958
AbstractThe introduction of counter tubes and the related instrument geometries have made it possible to obtain greatly improved x-ray powder patterns. Most of the important factors that must be understood in x-ray diffractometry are described in terms of their effect on the intensity, peak-to-background ratio, resolution and line shape.
openaire   +1 more source

High-resolution X-ray Diffractometry and Topography

Measurement Science and Technology, 2000
Over the last decade, high-resolution x-ray diffractometry and topography have played a vital role in providing a better understanding of thin film materials and the development of high-quality crystals for devices. As the importance of high-quality thin films and multilayer structures continues to grow, more and more scientists and engineers have ...
openaire   +1 more source

X-Ray Powder Diffractometry

2013
Alejandro G. Marangoni, M. Fernanda Peyronel   +1 more
openaire   +2 more sources

Water structure in 100 nm nanochannels revealed by nano X-ray diffractometry and Raman spectroscopy

Journal of Molecular Liquids, 2022
Koji Yoshida, Hiroki Koreeda, Takehiko Kitamori   +2 more
exaly  

Quantitative X-Ray Diffractometry

1995
Lev S. Zevin, Giora Kimmel
openaire   +1 more source

Quantitative X-ray Diffractometry

Zeitschrift für Physikalische Chemie, 1997
openaire   +1 more source

Transparency Factor for X-ray Diffractometry

TANSO, 1972
Isao TOMIZUKA, Kiyoshi SHIRAI, Osamu WATANABE   +2 more
openaire   +1 more source

Applications of synchrotron powder X-ray diffractometry in drug substance and drug product characterization

TrAC - Trends in Analytical Chemistry, 2021
Bhushan Munjal, Raj Suryanarayanan
exaly