Results 221 to 230 of about 32,038 (270)

Extra lines in X-ray diffractometry

1970
A diffractometer trace is recorded of a compound known to contain a high concentration of Ba. The pattern is characterized by a very strong line with a d -spacing of 3.08 A, plus many others. A weak, broad line was observed above a rather high background at approximately 6.5 o(2θ).
R. Jenkins, J. L. de Vries
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Parallel Beam and Focusing X-Ray Powder Diffractometry

Advances in X-ray Analysis, 1988
AbstractComparison of results using synchrotron radiation and X-ray tubes requires a knowledge of the fundamentally different profile shapes inherent in the methods. The varying asymmetric shapes and peak shifts in focusing geometry limit the accuracy and applications of the method and their origins are reviewed.
W. Parrish, M. Hart
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Optimum resolution in X-ray energy-dispersive diffractometry

Journal of Applied Crystallography, 1978
The resolution problem in X-ray energy-dispersive diffractometry is discussed. It is shown that for a given characteristic of the solid-state detector system and a given range of interplanar spacings, an optimum scattering angle can be easily found for any divergence of the incident and scattered beams.
Buras, B., Niimura, N., Olsen, J. S.
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Low Temperature Attachment For X-Ray Powder Diffractometry

Advances in X-ray Analysis, 1993
AbstractA low temperature attachment based on a miniature open-cycle Joule-Thomson refrigerator has been developed for x-ray diffractometry measurements over the temperature range from 65 - 400 K, By use of a special mounting plate, the device can be substituted for the heater assembly of a high temperature attachment and thereby utilize the available ...
H. W. King, M. A. Peters, E. A. Payzant, M. B. Stanley   +3 more
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Error Corrections For X-RAY Powder Diffractometry

Canadian Metallurgical Quarterly, 2001
AbstractThe errors involved in precision lattice parameter determination fall into three broad groups: errors that can be corrected by applying a multiplication factor to the determined parameter(s), errors arising from a constant shift in peak position, and errors arising from a Bragg angle dependent shift in peak position.
H.W. King, E.A. Payzant
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Numerical Control X-Ray Powder Diffractometry

Advances in X-ray Analysis, 1966
AbstractRecent development of numerical control, N/C, systems for digital X-ray powder diffractometry opens the full potential for rapid and detailed machine processing of digital diffraction data. This capability may prove to be as large an incremental technological advance as the earlier shift from film to counter detector techniques.
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Geometric aspects of X-ray diffractometry

1995
Powder diffractometers were initially designed for the consequent or scanning mode of operation. In these instruments, the detector scans the desirable range of scattering angles, and thus a diffraction pattern is produced. There is a limited time (usually seconds) in which to measure the intensity of the narrow diffraction peak in comparison with ...
Lev S. Zevin, Giora Kimmel, Inez Mureinik   +2 more
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Precision X-Ray Diffractometry using Powder Specimens^*

Advances in X-ray Analysis, 1962
AbstractThe counter tube diffractometer method for determining d spacings is often rejected for precision work because of lack of information concerning the nature and significance of the inherent errors. Errors concerned with the geometry of the method, the nature of the X-ray source, and the technique of collecting data have all been analyzed ...
L. F. Vassamillet, H. W. King
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Instrumentation for Synchrotron X-Ray Powder Diffractometry

Advances in X-ray Analysis, 1985
AbstractThe instrumentation developed for poly crystalline diffractometry using the storage ring at the Stanford Synchrotron Radiation Laboratory is described. A pair of automated vertical scan diffractometers was used for a Si (111) channel monochromator and the powder specimens.
W. Parrish, M. Hart, C. G. Erickson, N. Masciocchi, T. C. Huang   +4 more
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Fundamental techniques for X-ray diffractometry

1998
Abstract Two main types of equipment are used now to obtain X-rays for crystallographic applications. They are X-ray generators with X-ray tubes and synchrotrons. The generation of X-rays requires a source of electrons (either ions or some other charged particles) with sufficiently high energy.
L A Aslanov, G V Fetisov
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