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Parallel-beam X-ray diffractometry using X-ray guide tubes
Journal of Applied Crystallography, 2000A parallel-beam X-ray diffraction geometry using X-ray guide tubes is proposed to eliminate preferred-orientation effects in powder X-ray diffraction (XRD) patterns and for new applications of XRD. A bundle of X-ray guide tubes (polycapillaries) is used to provide an intense quasi-parallel (approximately 0.2° divergence) and large-diameter ...
Toyoko Yamanoi, Hiromoto Nakazawa
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Escape Peaks in X-Ray Diffractometry
Advances in X-ray Analysis, 1964AbstractEscape peaks occur when the incident X-ray quantum, energy exceeds the absorption edge energy of the detector element and the resulting X-ray fluorescence is lost from the detector. The most common escape peaks result from 1 K-fluorescence in NaI-scintillation counters and Xe K-, Xe L-, and Kr K-fluorescence in proportional counters.
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Particle statistics in X-ray diffractometry
1970Only those crystallites having the reflecting planes almost parallel to the specimen surface can contribute to a certain reflection. The intensity of the resulting diffraction is thus dependent on this number of crystallites. Intensities of different diffraction lines or between different specimens can only be compared if the number of particles ...
R. Jenkins, J. L. de Vries
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Extra lines in X-ray diffractometry
1970A diffractometer trace is recorded of a compound known to contain a high concentration of Ba. The pattern is characterized by a very strong line with a d -spacing of 3.08 A, plus many others. A weak, broad line was observed above a rather high background at approximately 6.5 o(2θ).
R. Jenkins, J. L. de Vries
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Parallel Beam and Focusing X-Ray Powder Diffractometry
Advances in X-ray Analysis, 1988AbstractComparison of results using synchrotron radiation and X-ray tubes requires a knowledge of the fundamentally different profile shapes inherent in the methods. The varying asymmetric shapes and peak shifts in focusing geometry limit the accuracy and applications of the method and their origins are reviewed.
W. Parrish, M. Hart
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Optimum resolution in X-ray energy-dispersive diffractometry
Journal of Applied Crystallography, 1978The resolution problem in X-ray energy-dispersive diffractometry is discussed. It is shown that for a given characteristic of the solid-state detector system and a given range of interplanar spacings, an optimum scattering angle can be easily found for any divergence of the incident and scattered beams.
Buras, B., Niimura, N., Olsen, J. S.
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Low Temperature Attachment For X-Ray Powder Diffractometry
Advances in X-ray Analysis, 1993AbstractA low temperature attachment based on a miniature open-cycle Joule-Thomson refrigerator has been developed for x-ray diffractometry measurements over the temperature range from 65 - 400 K, By use of a special mounting plate, the device can be substituted for the heater assembly of a high temperature attachment and thereby utilize the available ...
H. W. King +3 more
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Error Corrections For X-RAY Powder Diffractometry
Canadian Metallurgical Quarterly, 2001AbstractThe errors involved in precision lattice parameter determination fall into three broad groups: errors that can be corrected by applying a multiplication factor to the determined parameter(s), errors arising from a constant shift in peak position, and errors arising from a Bragg angle dependent shift in peak position.
H.W. King, E.A. Payzant
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Numerical Control X-Ray Powder Diffractometry
Advances in X-ray Analysis, 1966AbstractRecent development of numerical control, N/C, systems for digital X-ray powder diffractometry opens the full potential for rapid and detailed machine processing of digital diffraction data. This capability may prove to be as large an incremental technological advance as the earlier shift from film to counter detector techniques.
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Geometric aspects of X-ray diffractometry
1995Powder diffractometers were initially designed for the consequent or scanning mode of operation. In these instruments, the detector scans the desirable range of scattering angles, and thus a diffraction pattern is produced. There is a limited time (usually seconds) in which to measure the intensity of the narrow diffraction peak in comparison with ...
Lev S. Zevin +2 more
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