Results 201 to 210 of about 30,580 (243)
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Precision X-Ray Diffractometry using Powder Specimens*

Advances in X-ray Analysis, 1962
AbstractThe counter tube diffractometer method for determining d spacings is often rejected for precision work because of lack of information concerning the nature and significance of the inherent errors. Errors concerned with the geometry of the method, the nature of the X-ray source, and the technique of collecting data have all been analyzed ...
L. F. Vassamillet, H. W. King
openaire   +1 more source

Instrumentation for Synchrotron X-Ray Powder Diffractometry

Advances in X-ray Analysis, 1985
AbstractThe instrumentation developed for poly crystalline diffractometry using the storage ring at the Stanford Synchrotron Radiation Laboratory is described. A pair of automated vertical scan diffractometers was used for a Si (111) channel monochromator and the powder specimens.
W. Parrish   +4 more
openaire   +1 more source

Fundamental techniques for X-ray diffractometry

1998
Abstract Two main types of equipment are used now to obtain X-rays for crystallographic applications. They are X-ray generators with X-ray tubes and synchrotrons. The generation of X-rays requires a source of electrons (either ions or some other charged particles) with sufficiently high energy.
L A Aslanov, G V Fetisov
openaire   +1 more source

X-Ray Diffractometry with Slightly Absorbing Samples

Journal of Applied Physics, 1959
A method for measuring x-ray diffraction intensities of samples which are deeply penetrated, such as liquid and nitreous materials, is described. The sensitive angle of the detector is limited by a scatter slit which is focused on exactly the same area of the sample surface as is illuminated by the primary beam.
H. A. Levy, P. A. Agron, M. D. Danford
openaire   +1 more source

Compression Apparatus for Powder X-Ray Diffractometry

Review of Scientific Instruments, 1962
A compression apparatus has been constructed which is an integral part of a Norelco diffractometer shaft. The diffraction pattern of a sample can be obtained while it is under pressures up to 30 000 psi.
H. Steinfink, J. E. Gebhart
openaire   +1 more source

Advances in X-Ray Diffractometry of Clay Minerals

Clays and clay minerals (National Conference on Clays and Clay Minerals), 1958
AbstractThe introduction of counter tubes and the related instrument geometries have made it possible to obtain greatly improved x-ray powder patterns. Most of the important factors that must be understood in x-ray diffractometry are described in terms of their effect on the intensity, peak-to-background ratio, resolution and line shape.
openaire   +1 more source

High-resolution X-ray Diffractometry and Topography

Measurement Science and Technology, 2000
Over the last decade, high-resolution x-ray diffractometry and topography have played a vital role in providing a better understanding of thin film materials and the development of high-quality crystals for devices. As the importance of high-quality thin films and multilayer structures continues to grow, more and more scientists and engineers have ...
openaire   +1 more source

X-Ray Powder Diffractometry

2013
Alejandro G. Marangoni   +1 more
openaire   +2 more sources

Quantitative X-Ray Diffractometry

1995
Lev S. Zevin, Giora Kimmel
openaire   +1 more source

Quantitative X-ray Diffractometry

Zeitschrift für Physikalische Chemie, 1997
openaire   +1 more source

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