Results 11 to 20 of about 280,699 (310)

Facilely Fabricated Bright Lead‐Free Perovskite Cs3Cu2I5 Scintillator Film for High‐Definition X‐Ray Imaging

Advanced Photonics Research, 2022
Scintillator is a critical component to detect high‐energy particles or rays, which is widely used in deep space exploration, security inspection, and nondestructive testing and medical diagnosis, such as X‐ray imaging and computed tomography (CT ...
Heng Guo, Qingxian Zhao, Peng Ran, Jinping Chen, Yizhi Zhu, Qingsong Jiang, Yuling Tang, Zhenhua Zhang, Lei Song, Chunxiang Xu, Shouhua Luo, Zengliang Shi   +11 more
doaj   +1 more source

Characterization of SiGe thin films using a laboratory X-ray instrument [PDF]

, 2013
The technique of reciprocal space mapping using X-rays is a recognized tool for the nondestructive characterization of epitaxial films. X-ray scattering from epitaxial Si0.4Ge0.6 films on Si(100) substrates using a laboratory X-ray source was ...
Myronov, Maksym, Benediktovitch, Andrei, Ulyanenkova, Tatjana, Mikhalychev, Alexander, Ulyanenkov, Alexander P., Halpin, John E.   +5 more
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Complementary methodologies for thin film characterization in one tool - a novel instrument for 450 mm wafers [PDF]

, 2013
The scaling down of critical dimensions for the manufacturing of nanoelectronics requires the continuous introduction of new materials. The results of the analysis of thin high-k films made from Al2O3 as reference samples were used at multiple ...
Petrik, P., Fliegauf, R., Roederd, Georg, Holfelder, I., Weser, Jan, Beckhoff, B., Nutsch, Andreas, Hoenicke, P., Petrik, Péter, Weser, J., Nutsch, A., Holfelder, Ina, Röder, G., Fliegauf, Rolf, Beckhoff, Burkhard, Hönicke, Philipp   +15 more
core   +1 more source

X-ray studies of annealing in thin-film semiconductors [PDF]

, 1997
One of the most important issues in thin-film heterostructures is the nature of the interfaces. In general, their structure is likely to involve some degree of lattice strain, especially when the film is deposited on a mismatched substrate. The evolution
Roy Clarke, Clarke, Roy
core   +1 more source

Carbon window soft x-ray imaging using multilayer optics

, 2022
Paper 59190EThe paper deals with the recent results of the experiments on soft X-ray imaging of various carbon-containing objects: biological samples, artificial carbon fibres, graphite slices, etc.
Uspenski, Y.A., Kondratenko, V.V., Bugayev, Y., Vinogradov, A.V., Kasyanov, Y.S., Schäfers, F., Feigl, T., Devizenko, O.Y., Artyukov, I.A., Saveliev, S.V., Feschenko, R.M., Romanova, S.A.   +11 more
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Pengolahan Film Radiografi Secara Otomatis Menggunakan Automatic X-Ray Film Processor Model Jp-33

Buletin Fisika, 2017
A research on the process of forming an image on a radiographic film and processing techniques automatically has been done. The study was conducted using an X-ray plane Toshiba E 7239, Fil AGFA Healtcare HV Septestraat 27B2640 Mortsel and an automatic ...
Zoucella Andre Afani, Ni Nyoman Rupiasih
doaj   +1 more source

Acoustic response of a laser-excited polycrystalline Au-film studied by ultrafast Debye–Scherrer diffraction at a table-top short-pulse x-ray source

AIP Advances, 2020
The transient acoustic response of a free-standing, polycrystalline thin Au-film upon femtosecond optical excitation has been studied by time-resolved Debye–Scherrer x-ray diffraction using ultrashort Cu Kα x-ray pulses from a laser-driven plasma x-ray ...
W. Lu, M. Nicoul, U. Shymanovich, F. Brinks, M. Afshari, A. Tarasevitch, D. von der Linde, K. Sokolowski-Tinten   +7 more
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Layered Sol–Gel Deposition of a Sn, Ti, Zn, and Pr Mixed Oxide Thin Film with Electrical Properties for Gas Sensing

Gels, 2023
This article presents a layered mixed oxide thin film composed of Sn, Ti, Zn, and Pr obtained by sol–gel deposition for gas sensing applications. The film was characterized by X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), Raman ...
Izabella Dascalu, Cristian Hornoiu, Jose Maria Calderon Moreno, Petre Osiceanu, Simona Somacescu   +4 more
doaj   +1 more source

Investigation on thermal evaporated CH3NH3PbI3 thin films

AIP Advances, 2015
CH3NH3I, PbI2 and CH3NH3PbI3 films were fabricated by evaporation and characterized with X-ray Photoelectron Spectroscopy (XPS) and X-ray diffraction (XRD).
Youzhen Li, Xuemei Xu, Chenggong Wang, Congcong Wang, Fangyan Xie, Junliang Yang, Yongli Gao   +6 more
doaj   +1 more source

Structural and morphological dataset for rf-sputtered WC-Co thin films using synchrotron radiation methods

Data in Brief, 2019
Control and manipulation of synthesis parameters of thin film coatings is of critical concern in determination of material properties and performance.
R.R. Phiri, O.P. Oladijo, H. Nakajima, A. Rattanachata, E.T. Akinlabi   +4 more
doaj   +1 more source