Results 191 to 200 of about 59,512 (219)
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Spectrochimica Acta Part B: Atomic Spectroscopy, 1998
Solid-phase chromatography on silica gel columns can be used as a sample preparation technique for seawater, followed by total-reflection X-ray fluorescence analysis (TXRF). An automated extraction system (Zymark AutoTrace SPE Workstation) was studied for the analysis of blank solutions, seawater samples and certified reference materials.
Wolfgang Gerwinski, Diether Schmidt
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Solid-phase chromatography on silica gel columns can be used as a sample preparation technique for seawater, followed by total-reflection X-ray fluorescence analysis (TXRF). An automated extraction system (Zymark AutoTrace SPE Workstation) was studied for the analysis of blank solutions, seawater samples and certified reference materials.
Wolfgang Gerwinski, Diether Schmidt
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Spectrochimica Acta Part B: Atomic Spectroscopy, 2010
Abstract Vapor phase treatment (VPT) is a pretreatment with hydrofluoric acid vapor to raise the sensitivity of total reflection X-ray fluorescence spectroscopy (TXRF) for trace metal analysis on silicon wafers. The International Organization for Standardization/Technical Committee 201/Working Group 2 (ISO/TC201/WG2) has been investigating the method
Hikari Takahara +3 more
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Abstract Vapor phase treatment (VPT) is a pretreatment with hydrofluoric acid vapor to raise the sensitivity of total reflection X-ray fluorescence spectroscopy (TXRF) for trace metal analysis on silicon wafers. The International Organization for Standardization/Technical Committee 201/Working Group 2 (ISO/TC201/WG2) has been investigating the method
Hikari Takahara +3 more
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Spectrochimica Acta Part B: Atomic Spectroscopy, 2004
Abstract The combination of vapor phase decomposition–droplet collection (VPD–DC) with total reflection-X-ray fluorescence spectrometry (TXRF) is a well-established method for metallic contamination analysis of Si wafers. However, the efficiency of the methodology is not fully quantitatively understood.
D. Hellin +5 more
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Abstract The combination of vapor phase decomposition–droplet collection (VPD–DC) with total reflection-X-ray fluorescence spectrometry (TXRF) is a well-established method for metallic contamination analysis of Si wafers. However, the efficiency of the methodology is not fully quantitatively understood.
D. Hellin +5 more
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Spectrochimica Acta Part B: Atomic Spectroscopy, 1991
Abstract Total reflection X-ray fluorescence (TXRF) analysis in combination with vapour phase decomposition (VPD) of the surface oxide is presented as a sensitive tool for monitoring metal trace contamination on silicon wafers. Sensitivities of the order of 10 9 atoms per cm 2 are obtained, e.g.
C. Neumann, P. Eichinger
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Abstract Total reflection X-ray fluorescence (TXRF) analysis in combination with vapour phase decomposition (VPD) of the surface oxide is presented as a sensitive tool for monitoring metal trace contamination on silicon wafers. Sensitivities of the order of 10 9 atoms per cm 2 are obtained, e.g.
C. Neumann, P. Eichinger
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Inorganic Materials, 2015
An original approach to the X-ray fuorescence analysis of metallutgical precious metal products, in terms of which an equation of a certain type determined from theoretical and semiempirical considerations was proposed instead of multiple regression equations, was described. This allows reducing the number of calibrating reference samples, considerably
A. V. Bakhtiarov +5 more
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An original approach to the X-ray fuorescence analysis of metallutgical precious metal products, in terms of which an equation of a certain type determined from theoretical and semiempirical considerations was proposed instead of multiple regression equations, was described. This allows reducing the number of calibrating reference samples, considerably
A. V. Bakhtiarov +5 more
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Journal of Analytical Atomic Spectrometry, 2011
In recent years, liquid-phase microextraction (LPME) has become one of the most valuable techniques for the preconcentration and separation of trace and ultratrace elements. LPME can be combined with an atomic technique which requires only a few microlitres of liquid to perform a measurement, e.g. electrothermal atomic absorption spectrometry.
Rafal Sitko +4 more
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In recent years, liquid-phase microextraction (LPME) has become one of the most valuable techniques for the preconcentration and separation of trace and ultratrace elements. LPME can be combined with an atomic technique which requires only a few microlitres of liquid to perform a measurement, e.g. electrothermal atomic absorption spectrometry.
Rafal Sitko +4 more
openaire +1 more source