Results 91 to 100 of about 202 (125)
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X-ray excited optical luminescence (XEOL): a potential tool for OELD studies
Thin Solid Films, 2000Abstract An X-ray excited optical luminescence (XEOL) technique using laboratory soft X-rays and synchrotron radiation in the visible-UV and soft X-ray region will be discussed. It is shown that XEOL takes advantage of the penetration power of the X-rays and the tunability of the photons from a synchrotron source.
Peng Zhang, I Coulthard, T K Sham
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Influence of the methods of synthesis and grain size distribution on XEOL spectra of CaWO4:xTb3+
Inorganic Chemistry Communication, 2022E.A Mukhanova +5 more
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Characterization of Materials: XEOL/XAFS
2001Lynda Söderholm, G K Liu, M F Reid
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RIXS, XEOL and XEOL Imaging of Rare-earth Phosphors at the L[sub 3,2]-edges
AIP Conference Proceedings, 2010Capabilities at the PNC‐XOR of the Advanced Photon Source to monitor Resonant Inelastic X‐ray Scattering (RIXS) in the intermediate X‐ray energy range using a wavelength dispersive spectrometer (WDX) and associated X‐ray Excited Optical Luminescence (XEOL) using an optical spectrometer will be described.
T. K. Sham +5 more
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XEOL Studies of Porous Silicon
Le Journal de Physique IV, 1997Oxidised porous silicon emits luminescence in two distinct bands in the visible region. The fast blue (τ ∼ ns) and slow red (τ ∼ μs at 300K) bands are studied via the separate methods of time-resolved XEOL in single-bunch mode and wavelength-selective and total XEOL in multi-bunch mode.
D. A. Hill +5 more
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XAFS and XEOL Studies of CdSe Nanostructures
AIP Conference Proceedings, 2007CdSe nanostructures, including spherical Quantum Dots and elongated nanorods capped with trioctylphosphine oxide,1‐Octadecanamine, Tetradecylphosphonic acid or ZnSe thin shell, have been synthesized with colloidal methods. Both UV‐Vis absorption and photoluminescence spectra show that the prepared nanostructures exhibit a quantum confinement effect.
J. G. Zhou +6 more
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Features of recording and calculating XEOL spectra
SPIE Proceedings, 2005Fluorescence techniques of recording EXAFS spectra are considered: XEOL and fluorescence EXAFS. The main causes of spectra distortions induced by both experiment conditions and mechanisms of luminescence's appearance under the action of synchrotron radiation.
Vyacheslav I. Kochubey +2 more
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Potentialities and Limitations of the XEOL-XAFS Technique
Le Journal de Physique IV, 1997XEOL spectroscopy offers an altemative method to study the local electronic and spatial structures of luminescent materials. This is because XAFS signal can be extracted from the XEOL excitation spectra recorded in the vicinity of X-ray absorption edges. Possible site-selectivity and high quantum yield are the main attractions of this technique.
A. Rogalev, J. Goulon
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New EXAFS Measurements by XEOL and TEY on Porous Silicon
Journal of Porous Materials, 2000Results of an EXAFS investigation on porous Silicon carried out by X-ray Excited Optical Luminescence (XEOL) and Total Electron Yield (TEY) techniques, at the Si K absorption edge, are reported. For the first time XEOL spectra of porous silicon have been recorded in a wide energy range (1800–2500 eV) and EXAFS signals have been singled out from them ...
Daldosso, Nicola +4 more
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