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Abstract We describe the design and capabilities of a new Continuous Wave X-ray Excited Optical Luminescence (CW-XEOL) and Time Resolved X-ray Excited Optical Luminescence (TR-XEOL) facility on the I18 beamline at the DIAMOND light source, the UK national synchrotron facility.
R.P. Taylor +3 more
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Features of XEOL spectra evaluation depending on optical density of the sample
Journal of X-Ray Science and Technology, 2005Effect of competition in excitation between luminescence centres and the rest of a sample on intensity of luminescence in the visual range under exciting with synchrotron radiation is considered. It is shown that the competition gives rise to distortion of XEOL spectra. In this case the obtained structure data are incorrect.
V I Kochubey
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Local order in light emitting porous silicon studied by XEOL and TEY
Journal of Luminescence, 1998Abstract The local structure of porous silicon has been studied exciting its optical luminescence by X-rays (XEOL). The photoluminescence yield and the total electron yield (TEY), recorded simultaneously as a function of the X-ray energy at the Si K edge, give rise to the extended X-ray absorption fine structures (EXAFS).
Paolo Fornasini +2 more
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XEOL XANES of ZnS(Cu) and porous Si
Physica B: Condensed Matter, 1995Abstract Using X-ray excited optical luminescence (XEOL), L- and K-edge photoluminescence yield (PLY) XANES of S and Si have been obtained on P31 (ZnS: Cu) and porous Si (PS), respectively. Both P31 and PS have a negative edge jump in PLY XANES at the L-edges. At S K-edge, for P31 the edge jump is positive.
I Coulthard, R A Rosenberg, T K Sham
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