Results 101 to 110 of about 202 (125)
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High-luminosity system for XEOL spectroscopy (abstract)

Review of Scientific Instruments, 1992
A high-luminosity system comprising optically matched sample chamber, monochromator-spectrograph, and detectors of luminescences has been designed for XEOL spectroscopy using synchrotron radiation. Exciting x-ray radiation penetrated the sample chamber through a window made of a Be foil. The sample is mounted on the sample holder of a nitrogen cryostat.
S. N. Ivanov   +2 more
openaire   +1 more source

Structure and Luminescence of Rare Earth-doped Silicon Oxides Studied Through XANES and XEOL

ECS Transactions, 2009
Luminescent Si-based materials are of significant interest due to their potential applications in the fields of photonics and solid state lighting. The use of rare earth dopants incorporated into Si-based materials allows the attainment of specific wavelengths of emission for color tunability.
Roschuk, T   +9 more
  +8 more sources

Time-resolved XEOL spectroscopy of new scintillators based on CsI

Review of Scientific Instruments, 1992
Spectral and kinetic properties of the fast intrinsic ultraviolet luminescence of CsI single crystals either pure or doped by Br, Cl, Rb, or K, studied under different types of excitation at temperatures from 80 to 550 K, are presented. Since conventional models of intrinsic luminescence in their ‘‘pure’’ form fail to explain the observed properties of
A. N. Belsky   +6 more
openaire   +1 more source

Influence of europium concentration on the XEOL spectra of Eu-doped CaWO4 obtained via sonification

Indian Journal of Physics
Elizaveta Mukhanova   +2 more
exaly   +2 more sources

X-ray excited optical luminescence (XEOL) study of porous silicon

Physica B: Condensed Matter, 1995
Abstract It has been postulated that light emission from porous silicon is caused by quantum confinement of the electron states within silicon wires formed by anodic electroetching of silicon. In order to investigate this hypothesis we have made measurements of the X-ray excited optical luminescence (XEOL) and the total electron yield (TEY) as a ...
R.F. Pettifer   +5 more
openaire   +1 more source

XANES and XEOL Studies of Luminescent Silicon Carbonitride (SiCN) Thin Films

ECS Meeting Abstracts, 2012
Abstract not Available.
Zahra Khatami   +3 more
openaire   +1 more source

XANES and XEOL Investigation of Cerium and Terbium Co-Doped Silicon Oxide Films

ECS Transactions, 2012
The luminescent and structural properties of cerium and terbium co-doped silicon oxide thin films were investigated through transmission electron microscopy, photoluminescence spectroscopy, and synchrotron-based X-ray absorption spectroscopy. While combined blue and green luminescence characteristic of Ce3+ and Tb3+ ions, respectively, was observed ...
Patrick R. Wilson   +6 more
openaire   +1 more source

X-ray absorption spectroscopy on light emitting porous silicon by XEOL and TEY

Journal of Non-Crystalline Solids, 1998
This paper presents an experimental investigation of the local structure of porous silicon based on X-ray absorption fine structure by two different techniques: Total electron yield (TEY) and X-ray excited optical luminescence (XEOL). The influence of the main parameters of sample preparation on both the photoluminescence and the local structure around
Dalba, Giuseppe   +5 more
openaire   +3 more sources

Magnetic circularly polarized X-ray excited optical luminescence (MCP-XEOL)

Radiation Effects and Defects in Solids, 2001
Abstract We present recent experimental results of magnetically induced circular polarization of X-ray excited optical luminescence of paramagnetic rare-earth ions. X-ray excitation offers not only the valuable advantage of a high quantum yield but also eliminates the contamination of the luminescence signal with scattered excitation light.
A. Rogalev, J. Goulon
openaire   +1 more source

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