Enhancing cell characterization with microfluidics and AI: a comprehensive review of mechanical, electrical, and hybrid techniques. [PDF]
Taha M, Pappa AM, Saleh H, Alazzam A.
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Structural or climatic control in granite landforms? The development of sheet strcture, foliation, boudinage and related features [PDF]
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Granite formations and granite cavities in northern Nigeria [PDF]
Szentes, G.
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Ocorrência de aragonite em mármores da região de Alvito-Viana do Alentejo (Zona de Ossa-Morena): significado geodinâmico [PDF]
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Bright and durable scintillation from colloidal quantum shells. [PDF]
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The albitic rocks (albitites) from N of Lugo and Asturias (Asturoccidental-leonesa zone) [PDF]
Roel, J.
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Abstract We describe the design and capabilities of a new Continuous Wave X-ray Excited Optical Luminescence (CW-XEOL) and Time Resolved X-ray Excited Optical Luminescence (TR-XEOL) facility on the I18 beamline at the DIAMOND light source, the UK national synchrotron facility.
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2D XANES-XEOL mapping: observation of enhanced band gap emission from ZnO nanowire arrays
Nanoscale, 2014Using two-dimensional X-ray absorption near-edge structure-X-ray excited optical luminescence (2D XANES-XEOL) spectroscopy, it is found that the band gap emission of ZnO nanowire arrays is substantially enhancedi.e.that the intensity ratio between the band gap and defect emissions increases by more than an order of magnitude when the excitation energy ...
Zhiqiang Wang, Tsun-Kong Sham
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X-ray excited optical luminescence (XEOL): a potential tool for OELD studies
Thin Solid Films, 2000Abstract An X-ray excited optical luminescence (XEOL) technique using laboratory soft X-rays and synchrotron radiation in the visible-UV and soft X-ray region will be discussed. It is shown that XEOL takes advantage of the penetration power of the X-rays and the tunability of the photons from a synchrotron source.
Peng Zhang
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Local order in light emitting porous silicon studied by XEOL and TEY
Journal of Luminescence, 1998Abstract The local structure of porous silicon has been studied exciting its optical luminescence by X-rays (XEOL). The photoluminescence yield and the total electron yield (TEY), recorded simultaneously as a function of the X-ray energy at the Si K edge, give rise to the extended X-ray absorption fine structures (EXAFS).
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