Results 141 to 150 of about 1,782 (177)
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X-ray excited optical luminescence (XEOL) detection of x-ray absorption fine structure (XAFS)
Journal of Chemical Physics, 1998The x-ray excited optical luminescence (XEOL) from a variety of rare-earth ions was used as a detection mode for the collection of L-edge x-ray absorption fine-structure (XAFS) data. In order to understand the source of the observed optical signal, advantage is taken of the known luminescent response of f ions in a variety of transparent host materials.
Mark R Antonio
exaly +2 more sources
RIXS, XEOL and XEOL Imaging of Rare-earth Phosphors at the L[sub 3,2]-edges
AIP Conference Proceedings, 2010Capabilities at the PNC‐XOR of the Advanced Photon Source to monitor Resonant Inelastic X‐ray Scattering (RIXS) in the intermediate X‐ray energy range using a wavelength dispersive spectrometer (WDX) and associated X‐ray Excited Optical Luminescence (XEOL) using an optical spectrometer will be described.
T. K. Sham +5 more
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XEOL Studies of Porous Silicon
Le Journal de Physique IV, 1997Oxidised porous silicon emits luminescence in two distinct bands in the visible region. The fast blue (τ ∼ ns) and slow red (τ ∼ μs at 300K) bands are studied via the separate methods of time-resolved XEOL in single-bunch mode and wavelength-selective and total XEOL in multi-bunch mode.
D. A. Hill +5 more
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Features of recording and calculating XEOL spectra
SPIE Proceedings, 2005Fluorescence techniques of recording EXAFS spectra are considered: XEOL and fluorescence EXAFS. The main causes of spectra distortions induced by both experiment conditions and mechanisms of luminescence's appearance under the action of synchrotron radiation.
Vyacheslav I. Kochubey +2 more
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High-luminosity system for XEOL spectroscopy (abstract)
Review of Scientific Instruments, 1992A high-luminosity system comprising optically matched sample chamber, monochromator-spectrograph, and detectors of luminescences has been designed for XEOL spectroscopy using synchrotron radiation. Exciting x-ray radiation penetrated the sample chamber through a window made of a Be foil. The sample is mounted on the sample holder of a nitrogen cryostat.
S. N. Ivanov +2 more
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XAFS and XEOL Studies of CdSe Nanostructures
AIP Conference Proceedings, 2007CdSe nanostructures, including spherical Quantum Dots and elongated nanorods capped with trioctylphosphine oxide,1‐Octadecanamine, Tetradecylphosphonic acid or ZnSe thin shell, have been synthesized with colloidal methods. Both UV‐Vis absorption and photoluminescence spectra show that the prepared nanostructures exhibit a quantum confinement effect.
J. G. Zhou +6 more
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Potentialities and Limitations of the XEOL-XAFS Technique
Le Journal de Physique IV, 1997XEOL spectroscopy offers an altemative method to study the local electronic and spatial structures of luminescent materials. This is because XAFS signal can be extracted from the XEOL excitation spectra recorded in the vicinity of X-ray absorption edges. Possible site-selectivity and high quantum yield are the main attractions of this technique.
A. Rogalev, J. Goulon
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New EXAFS Measurements by XEOL and TEY on Porous Silicon
Journal of Porous Materials, 2000Results of an EXAFS investigation on porous Silicon carried out by X-ray Excited Optical Luminescence (XEOL) and Total Electron Yield (TEY) techniques, at the Si K absorption edge, are reported. For the first time XEOL spectra of porous silicon have been recorded in a wide energy range (1800–2500 eV) and EXAFS signals have been singled out from them ...
Daldosso, Nicola +4 more
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XEOL XANES of ZnS(Cu) and porous Si
Physica B: Condensed Matter, 1995Abstract Using X-ray excited optical luminescence (XEOL), L- and K-edge photoluminescence yield (PLY) XANES of S and Si have been obtained on P31 (ZnS: Cu) and porous Si (PS), respectively. Both P31 and PS have a negative edge jump in PLY XANES at the L-edges. At S K-edge, for P31 the edge jump is positive.
D.T. Jiang +6 more
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