Results 151 to 160 of about 1,782 (177)
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Magnetic circularly polarized X-ray excited optical luminescence (MCP-XEOL)
Radiation Effects and Defects in Solids, 2001Abstract We present recent experimental results of magnetically induced circular polarization of X-ray excited optical luminescence of paramagnetic rare-earth ions. X-ray excitation offers not only the valuable advantage of a high quantum yield but also eliminates the contamination of the luminescence signal with scattered excitation light.
A. Rogalev, J. Goulon
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Time-resolved XEOL spectroscopy of new scintillators based on CsI
Review of Scientific Instruments, 1992Spectral and kinetic properties of the fast intrinsic ultraviolet luminescence of CsI single crystals either pure or doped by Br, Cl, Rb, or K, studied under different types of excitation at temperatures from 80 to 550 K, are presented. Since conventional models of intrinsic luminescence in their ‘‘pure’’ form fail to explain the observed properties of
A. N. Belsky +6 more
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X-ray excited optical luminescence (XEOL) study of porous silicon
Physica B: Condensed Matter, 1995Abstract It has been postulated that light emission from porous silicon is caused by quantum confinement of the electron states within silicon wires formed by anodic electroetching of silicon. In order to investigate this hypothesis we have made measurements of the X-ray excited optical luminescence (XEOL) and the total electron yield (TEY) as a ...
R.F. Pettifer +5 more
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An X-Ray Excited Optical Luminescence (XEOL) Analysis of Mn2+ Doped ZnS Nanostructures
AIP Conference Proceedings, 2007ZnS:Mn nanoribbons and ZnS:Mn,Eu triangular nanoprisms grown by thermal evaporation of ZnS powder mixtures containing MnCl2, and MnCl2 + EuCl3 powders respectively were investigated using X‐ray excited optical luminescence (XEOL) together with X‐ray absorption fine structure spectroscopy (XAFS) in total electron yield (TEY) and wavelength selected ...
Michael Murphy +4 more
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Features of XEOL spectra evaluation depending on optical density of the sample
Journal of X-Ray Science and Technology: Clinical Applications of Diagnosis and Therapeutics, 2005Effect of competition in excitation between luminescence centres and the rest of a sample on intensity of luminescence in the visual range under exciting with synchrotron radiation is considered. It is shown that the competition gives rise to distortion of XEOL spectra. In this case the obtained structure data are incorrect.
V.I. Kochubey, Ju. G. Konyukhova
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XANES and XEOL Investigation of Cerium and Terbium Co-Doped Silicon Oxide Films
ECS Transactions, 2012The luminescent and structural properties of cerium and terbium co-doped silicon oxide thin films were investigated through transmission electron microscopy, photoluminescence spectroscopy, and synchrotron-based X-ray absorption spectroscopy. While combined blue and green luminescence characteristic of Ce3+ and Tb3+ ions, respectively, was observed ...
Patrick R. Wilson +6 more
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Structure and Luminescence of Rare Earth-Doped Silicon Oxides Studied Through XANES and XEOL
ECS Meeting Abstracts, 2009Abstract not Available.
Tyler Roschuk +6 more
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X-ray absorption spectroscopy on light emitting porous silicon by XEOL and TEY
Journal of Non-Crystalline Solids, 1998This paper presents an experimental investigation of the local structure of porous silicon based on X-ray absorption fine structure by two different techniques: Total electron yield (TEY) and X-ray excited optical luminescence (XEOL). The influence of the main parameters of sample preparation on both the photoluminescence and the local structure around
Dalba, Giuseppe +5 more
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Chemical Geology, 1990
This paper investigates the practical application of XEOL as an autoradiography technique of use in characterising the mineralogy of geological samples. A simple apparatus is described in which thin sections are excited with a low-power X-ray tube operated at 19 kV, 0.9 mA.
Philip J. Potts, Andrew G. Tindle
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This paper investigates the practical application of XEOL as an autoradiography technique of use in characterising the mineralogy of geological samples. A simple apparatus is described in which thin sections are excited with a low-power X-ray tube operated at 19 kV, 0.9 mA.
Philip J. Potts, Andrew G. Tindle
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XANES and XEOL Studies of Luminescent Silicon Carbonitride (SiCN) Thin Films
ECS Meeting Abstracts, 2012Abstract not Available.
Zahra Khatami +3 more
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