Results 261 to 270 of about 3,446,366 (305)

Yield estimates for the TESH multicomputer network

17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings., 2003
Reconfiguration and yield issues are considered for parallel computing systems based on a new interconnection network, "Tori connected mESHes (TESH)." The network is hierarchical - thus allowing exploitation of computation locality as well as systematic expansion up to a million processors, permits efficient VLSI/ULSI realization, and appears to be ...
Bogdan M. Maziarz, Vijay K. Jain
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On estimating the yield and volatility curves

Kybernetika, 1997
Summary: Yield curve and yield volatilities are important inputs for pricing interest rate derivatives, for generation of interest rate scenarios, etc. Nonanticipated errors in their estimates may essentially influence the resulting prices, yields and risks.
Jitka Dupacová, Jozsef Abaffy, Marida Bertocchi, Marie Husková   +3 more
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A Priori Estimation of Organic Reaction Yields

Angewandte Chemie, 2015
AbstractA thermodynamically guided calculation of free energies of substrate and product molecules allows for the estimation of the yields of organic reactions. The non‐ideality of the system and the solvent effects are taken into account through the activity coefficients calculated at the molecular level by perturbed‐chain statistical associating ...
Emami, Fateme S., Vahid, Amir, Wylie, Elizabeth K., Szymkuc, Sara, Dittwald, Piotr, Molga, Karol, Grzybowski, Bartosz A.   +6 more
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Yield estimation via multi-cones

Proceedings of the 49th Annual Design Automation Conference, 2012
We propose a new yield estimation algorithm which estimates the acceptability region as the union of spherical cones. The algorithm works by dividing the input parameter space into approximately equi-probable cones, efficiently estimating the refined weight contributions for each cone, then combining the results to get the total yield. The algorithm is
Rouwaida Kanj, Rajiv V. Joshi, Zhuo Li 0001, Jerry Hayes, Sani R. Nassif   +4 more
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Maximum likelihood estimation of growth yields

Biotechnology and Bioengineering, 1982
AbstractThis work is concerned with statistical methods to estimate yield and maintenance parameters associated with microbial growth. For a given dilution rate, an experimenter typically measures substrate concentration, oxygen utilization rate, the rate of carbon dioxide evolution, and biomass concentration.
B O, Solomon, L E, Erickson, J E, Hess, S S, Yang   +3 more
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Accurate yield estimation of circuits with redundancy

Proceedings of International Workshop on Defect and Fault Tolerance in VLSI, 2002
Yield concerns owing to increasing die sizes have prompted designers to include redundant elements in the design. In this paper we present a technique for accurately estimating the yield of designs that employ redundancy. We show that conventional techniques that do not take into account the actual chip layout and defect statistics could result in ...
Dinesh D. Gaitonde, D. M. H. Walker, Wojciech Maly   +2 more
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Electromigration-dependent parametric yield estimation

Proceedings of the 2004 11th IEEE International Conference on Electronics, Circuits and Systems, 2004. ICECS 2004., 2005
We define and investigate the problem of electromigration faults caused by spot defects during the VLSI manufacturing process. Analysis is given for a simple layout, and simulations are presented and discussed for a more complicated case. It is shown that in some cases, electromigration-dependent parametric faults can make a significant contribution to
Roman Barsky, Israel A. Wagner
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Sensor defect probability estimation and yield

SPIE Proceedings, 2012
Sensor yield is directly related to the probability of defective pixel occurrence and the screening criteria. Assuming a spatially independent distribution of single pixel defects, effective on-the-fly correction of singlepixel defects in a color plane, and effective correction of two-pixel defects in a color plane (couplets) through a defect map ...
Honghong Peng, Brian W. Keelan
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On the accuracy of Monte Carlo yield estimators

2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration (VLSI-SoC), 2013
Since the statistical timing analysis of VLSI circuits became a necessity, the accuracy of the proposed statistical static timing analysis (SSTA) methods is checked with the Monte Carlo (MC) estimation methods, which are called golden. However, the MC methods can have very different levels of accuracy depending on the model used beneath the method.
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Yield Management Impacts on Airline Spill Estimation

Transportation Science, 1999
The correct estimation of spill, or passenger demand turned away, is an integral part of the determination of optimal aircraft capacities in the airline fleet assignment process. While making advances in the solution of the large-scale fleet assignment optimization problem, airlines have continued to use an aggregate approach to spill estimation. This
Peter Belobaba, András Farkas
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