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压敏电阻冲击老化过程中残压比变化的分析

open access: yesDianci bileiqi, 2014
残压比是衡量压敏电阻性能的一项重要指标,针对压敏电阻在冲击老化过程中残压比的变化问题,通过对压敏电阻样品进行8/20μs雷电流冲击老化试验,发现残压比在标称电流(In)冲击老化试验过程中呈现缓慢降低--缓慢增加--快速上升的变化趋势;根据双肖特基势垒理论及热老化理论分析,得出冲击过程中残压比的大小主要由晶界层状态所决定,残压比快速上升阶段是由于晶界层大量破坏的结论;提出了利用残压比变化率来衡量压敏电阻老化程度的方法,在实际应用中具有参考价值。
陈璞阳   +4 more
doaj  

[How I treat vasovagal syncope in children]. [PDF]

open access: yesZhongguo Dang Dai Er Ke Za Zhi
Zou RM, Wang C.
europepmc   +1 more source

[Development of a balloon sensor device for force-electrical coupling measurement of esophagus]. [PDF]

open access: yesSheng Wu Yi Xue Gong Cheng Xue Za Zhi
Ran P   +5 more
europepmc   +1 more source

[Rehabilitation guidelines and specifications for traumatic spinal cord injury (2025 edition)]. [PDF]

open access: yesZhongguo Xiu Fu Chong Jian Wai Ke Za Zhi
Professional Committee Of Spine And Spinal Cord Injury Rehabilitation China Association Of Rehabilitation Of Disabled Persons   +3 more
europepmc   +1 more source

[Research progress on the causes of pain in knee osteoarthritis]. [PDF]

open access: yesZhongguo Xiu Fu Chong Jian Wai Ke Za Zhi
Wei N, Zheng Z.
europepmc   +1 more source

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