Results 251 to 260 of about 4,797 (308)
Some of the next articles are maybe not open access.

Electrical characterization of analogue and RF integrated circuits by thermal measurements

Microelectronics Journal, 2007
This paper presents a novel technique for measuring the electrical characteristics of analogue circuits, based on measuring the temperature at the silicon surface close to the circuit under test. As a detailed example, the paper analyses how the gain of an amplifier can be observed through temperature measurements.
Josep Altet
exaly   +2 more sources

Robust design of low power CMOS analogue integrated circuits

open access: yesIEE Proceedings - Circuits, Devices and Systems, 2001
As feature sizes move into the deep submicron ranges and power supply voltages are reduced, the effect of both device mismatch and inter-die process variations on the performance and reliability of analogue integrated circuits is magnified. The statistical MOS (SMOS) model accounts for both inter-die and intra-die variations.
T.B. Tarim, M. Ismail
openaire   +2 more sources

A design for testability approach for nano-CMOS analogue integrated circuits

International Journal of Electronics, 2013
Dependability requirements must be considered from the beginning when designing safety-critical systems. Therefore, testing should even be considered earlier, intertwined with the design process. The process of designing for better testability is called design for testability (DfT).
Belgacem Hamdi   +2 more
exaly   +2 more sources

Design-for-test strategies for analogue and mixed-signal integrated circuits

open access: yes38th Midwest Symposium on Circuits and Systems. Proceedings, 2002
Recent advances in technology are leading to increases in the complexity and applications of analogue and mixed-signal integrated circuits. This trend has been accompanied by an increase in the complexity of associated test specifications. Furthermore, the use of functional and specification based test programs for the analogue circuitry is being ...
Olbrich, T   +3 more
openaire   +2 more sources

System level performance and yield optimisation for analogue integrated circuits. [PDF]

open access: yes, 2009
Advances in silicon technology over the last decade have led to increased integration of analogue and digital functional blocks onto the same single chip. In such a mixed signal environment, the analogue circuits must use the same process technology as their digital neighbours.
Md Ali, Sawal Hamid
openaire   +2 more sources

Integrated circuits for analogue systems

Microelectronics Reliability, 1973
Because of the need for a large market and the initial problems with technically complex circuits, integrated circuits developed later for analogue than for digital systems. There are now two reasonably distinct groups of analogue circuits, namely those for professional use and those for incorporation in consumer equipment.In the former category ...
openaire   +2 more sources

Memristor-Enabled Reconfigurable Integrated Circuits [PDF]

open access: yes, 2020
© 2020 IEEE. The holy grail of analogue integrated circuit design is adjustable analogue delay element. Of course, all analogue circuits are filters.
Christos Papavassiliou   +2 more
exaly   +2 more sources

GaAs sampled-analogue integrated circuits

Journal of the Institution of Electronic and Radio Engineers, 1987
Sampled-analogue design technique is a rather neglected area of GaAs i. e. exploitation which has a wide range of potential applications in the area of high performance filtering through the use of the techniques described here. Although many other devices such as analogue to digital converters (ADCs) properly fall within the scope of this paper, they ...
J.A. Phillips, S.J. Harrold, G.K. Barker
openaire   +1 more source

Thermal Testing of Analogue Integrated Circuits: A Case Study

Journal of Electronic Testing, 2003
This paper discusses the use of temperature as a test observable for analogue circuits, presenting a generic configuration for analogue circuit thermal testing. As a case study, static temperature analysis is performed over a two-stage operational amplifier in view of extracting temperature waveforms at different locations on the circuit under test ...
Josep Altet, André Ivanov, A. Wong
openaire   +1 more source

Analogue integrated circuits electrothermal modelling

Experience of Designing and Applications of CAD Systems in Microelectronics. Proceedings of the VI-th International Conference. CADSM 2001 (IEEE Cat. No.01 EX473), 2002
Recent models of electronic devices included in most popular simulation programs hardly simulate the thermal effects. It is possible only to set the fixed temperature of the entire die to consider the influence of equal temperature on the electric parameters of those devices.
S. Bieganski, A. Napieralski
openaire   +1 more source

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