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Noncontact atomic force microscopy II [PDF]
Cataloged from PDF version of article.Background: Highly ordered three-dimensional colloidal crystals (supracrystals) comprised of 7.4 nm diameter Au nanocrystals (with a 5% size dispersion) have been imaged and analysed using a combination of scanning ...
Mehmet Z. Baykara, Udo D. Schwarz
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Localization atomic force microscopy [PDF]
Understanding structural dynamics of biomolecules at the single-molecule level is vital to advancing our knowledge of molecular mechanisms. Currently, there are few techniques that can capture dynamics at the sub-nanometre scale and in physiologically relevant conditions.
G. Heath+6 more
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Advances in atomic force microscopy [PDF]
This article reviews the progress of atomic force microscopy in ultrahigh vacuum, starting with its invention and covering most of the recent developments. Today, dynamic force microscopy allows us to image surfaces of conductors and insulators in vacuum
F. Giessibl
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Atomic force microscopy-based mechanobiology [PDF]
Nature Reviews Physics, 1 (1)
M. Krieg+9 more
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Advanced atomic force microscopy techniques [PDF]
This article is part of the Thematic Series "Advanced atomic force microscopy techniques".
Thilo Glatzel+5 more
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Quantitative Electromechanical Atomic Force Microscopy. [PDF]
The ability to probe a materials electromechanical functionality on the nanoscale is critical to applications from energy storage and computing to biology and medicine.
L. Collins+3 more
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Interpreting motion and force for narrow-band intermodulation atomic force microscopy
Intermodulation atomic force microscopy (ImAFM) is a mode of dynamic atomic force microscopy that probes the nonlinear tip–surface force by measurement of the mixing of multiple modes in a frequency comb.
Daniel Platz+3 more
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Noncontact atomic force microscopy [PDF]
Udo D. Schwarz
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Atomic Force Microscopy: Step Height Measurement Uncertainty Evaluation
The atomic force microscope (AFM) enables the measurement of sample surfaces at the nanoscale. Reference standards with calibration gratings are used for the adjustment and verification of AFM measurement devices.
Andrej Razumić+6 more
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Progress in the Correlative Atomic Force Microscopy and Optical Microscopy
Atomic force microscopy (AFM) has evolved from the originally morphological imaging technique to a powerful and multifunctional technique for manipulating and detecting the interactions between molecules at nanometer resolution.
Lulu Zhou+3 more
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