Results 21 to 30 of about 410,646 (334)
Polynomial force approximations and multifrequency atomic force microscopy
Beilstein Journal of Nanotechnology, 2013 We present polynomial force reconstruction from experimental intermodulation atomic force microscopy (ImAFM) data. We study the tip–surface force during a slow surface approach and compare the results with amplitude-dependence force spectroscopy (ADFS ...
Daniel Platz +3 more
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Models for quantitative charge imaging by atomic force microscopy [PDF]
, 2001 Two models are presented for quantitative charge imaging with an atomic-force microscope. The first is appropriate for noncontact mode and the second for intermittent contact (tapping) mode imaging.
Atwater, Harry A. +3 more
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Atomic Force Microscopy: An Introduction
, 2017 Imaging of nano-sized particles and sample features is crucial in a variety of research fields. For instance in biological sciences, where it is paramount to investigate structures at the single particle level. Often two-dimensional images are not sufficient and further information such as topography and mechanical properties are required. Furthermore,
Piontek, Melissa C, Roos, Wouter H
openaire +3 more sources
Piezoresistive sensors for atomic force microscopy
Journal of Telecommunications and Information Technology, 2001 An important element in microelectronics is the comparison of the modelling and measurements results of the real semiconductor devices. Our paper describes the final results of numerical simulation of a micromechanical process sequence of the atomic ...
Tomasz Dębski +6 more
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Combined Traction Force–Atomic Force Microscopy Measurements of Neuronal Cells
Biomimetics, 2022 In the course of the development of the nervous system, neuronal cells extend (grow) axons, which navigate over distances of the order of many cell diameters to reach target dendrites from other neurons and establish neuronal circuits.
Udathari Kumarasinghe +2 more
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Device for in-situ cleaving of hard crystals [PDF]
, 2005 Cleaving crystals in a vacuum chamber is a simple method for obtaining atomically flat and clean surfaces for materials that have a preferential cleaving plane.
A. Renner +4 more
core +2 more sources
Microscopy Today, 1992 The basic principles of atomic force microscopy are discussed. Various deflection sensors are described and compared with each other. A simple theoretical basis of the fundamental forces, such as van der Waals, electrostatic, magnetic, capillary, ionic repulsion and frictional forces, is given and the relevant experimental work is summarized.
openaire +2 more sources
Atomic Force Microscopy of height fluctuations of fibroblast cells [PDF]
, 2002 We investigated the nanometer scale height fluctuations of 3T3 fibroblast cells with the atomic force microscope (AFM) under physiological conditions. Correlation between these fluctuations and lateral cellular motility can be observed.
A. Czirók +31 more
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Profilometry and atomic force microscopy for surface characterization
Nano TransMed, 2023 : Aim: This study aims to evaluate and compare the profilometry and atomic force microscopy (AFM) for characterization of biomaterial surfaces. Method: The clinically commonly used titanium (Ti) was used as the specimen. Each of the specimen was prepared
Li Mei, Guangzhao Guan
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Crosstalk Correction in Atomic Force Microscopy
, 2006 Commercial atomic force microscopes usually use a four-segmented photodiode to detect the motion of the cantilever via laser beam deflection. This read-out technique enables to measure bending and torsion of the cantilever separately.
E. Soergel +4 more
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