Results 41 to 50 of about 770,384 (397)
Nature Communications, 2018 Scanning probe microscopy has been extensively applied to probe interfacial water in many interdisciplinary fields but the disturbance of the probes on the hydrogen-bonding structure of water has remained an intractable problem.
Jinbo Peng +10 more
semanticscholar +1 more source
qPlus Magnetic Force Microscopy in Frequency-Modulation Mode with milli-Hertz Resolution [PDF]
Beilstein J. Nanotechnol. 3, 174-178 (2012), 2011 Magnetic force microscopy (MFM) allows one to image the domain structure of ferromagnetic samples by probing the dipole forces between a magnetic probe tip and a magnetic sample. The magnetic domain structure of the sample depends on the atomic arrangement of individual electron spins.
arxiv +1 more source
Atomic Force Microscopy: An Introduction
, 2017 Imaging of nano-sized particles and sample features is crucial in a variety of research fields. For instance in biological sciences, where it is paramount to investigate structures at the single particle level. Often two-dimensional images are not sufficient and further information such as topography and mechanical properties are required. Furthermore,
Wouter H. Roos, Melissa C. Piontek
openaire +4 more sources
Limit of Temporal Resolution in Atomic Force Microscopy: How fast can we image with atomically-engineered tips while preserving picometer range spatial resolution? [PDF]
Phys. Rev. Applied 11, 024068 (2019), 2018 With recent advances in dynamic scanning probe microscopy techniques, it is now a routine to image the sub-molecular structure of molecules with atomically-engineered tips which are prepared via controlled modification of the tip termination and are chemically well-defined.
arxiv +1 more source
Local spectroscopy and atomic imaging of tunneling current, forces and dissipation on graphite [PDF]
, 2005 Theory predicts that the currents in scanning tunneling microscopy (STM) and the attractive forces measured in atomic force microscopy (AFM) are directly related. Atomic images obtained in an attractive AFM mode should therefore be redundant because they
C. F. Quate +7 more
core +2 more sources
Clay surface characteristics using atomic force microscopy
Revista Facultad de Ingeniería Universidad de Antioquia, 2018 El primer componente para la fabricación de productos de mampostería para la construcción es la arcilla, la cual aporta la plasticidad que facilita el moldeo y el manejo del producto. El segundo componente es el feldespato en su formación como alúmina (
Ricardo Andrés García-León +2 more
doaj +3 more sources
Crosstalk Correction in Atomic Force Microscopy
, 2006 Commercial atomic force microscopes usually use a four-segmented photodiode to detect the motion of the cantilever via laser beam deflection. This read-out technique enables to measure bending and torsion of the cantilever separately.
E. Soergel +4 more
core +1 more source
Mechanical-Diode based Ultrasonic Atomic Force Microscopies [PDF]
, 2019 Recent advances in mechanical-diode based ultrasonic force microscopy techniques are reviewed. The potential of Ultrasonic Force Microscopy (UFM) for the study of material elastic properties is explained in detail. Advantages of the application of UFM in nanofabrication are discussed.
arxiv +1 more source
Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements [PDF]
Rev.Sci.Instrum.78:103707,2007, 2007 Torsional harmonic cantilevers allow measurement of time varying tip-sample forces in tapping-mode atomic force microscopy. Accuracy of these force measurements is important for quantitative nanomechanical measurements. Here we demonstrate a method to convert the torsional deflection signals into a calibrated force waveform with the use of non-linear ...
arxiv +1 more source
Nanophotonics, 2019 Scanning probe techniques have evolved significantly in recent years to detect surface morphology of materials down to subnanometer resolution, but without revealing spectroscopic information.
Jahan Nusrat +6 more
doaj +1 more source