Results 41 to 50 of about 613,647 (384)

Profilometry and atomic force microscopy for surface characterization

Nano TransMed, 2023
: Aim: This study aims to evaluate and compare the profilometry and atomic force microscopy (AFM) for characterization of biomaterial surfaces. Method: The clinically commonly used titanium (Ti) was used as the specimen. Each of the specimen was prepared
Li Mei, Guangzhao Guan
doaj   +1 more source

Atomic- and Molecular-Resolution Mapping of Solid-Liquid Interfaces by 3D Atomic Force Microscopy.

ACS Nano, 2018
Hydration layers are ubiquitous in life and technology. Hence, interfacial aqueous layers have a central role in a wide range of phenomena from materials science to molecular and cell biology.
T. Fukuma, Ricardo Garcia
semanticscholar   +1 more source

Crosstalk Correction in Atomic Force Microscopy

, 2006
Commercial atomic force microscopes usually use a four-segmented photodiode to detect the motion of the cantilever via laser beam deflection. This read-out technique enables to measure bending and torsion of the cantilever separately.
E. Soergel, Meyer E., Rodriguez B. J., T. Jungk, Á. Hoffmann   +4 more
core   +1 more source

Device for in-situ cleaving of hard crystals [PDF]

, 2005
Cleaving crystals in a vacuum chamber is a simple method for obtaining atomically flat and clean surfaces for materials that have a preferential cleaving plane.
A. Renner, Eberhart M. E., F. J. Giessibl, Kim Y. -C., M. Schmid   +4 more
core   +2 more sources

Clay surface characteristics using atomic force microscopy

Revista Facultad de Ingeniería Universidad de Antioquia, 2018
El primer componente para la fabricación de productos de mampostería para la construcción es la arcilla, la cual aporta la plasticidad que facilita el moldeo y el manejo del producto. El segundo componente es el feldespato en su formación como alúmina (
Ricardo Andrés García-León, Eder Norberto Flórez-Solano, Carlos Humberto Acevedo-Peñaloza   +2 more
doaj   +3 more sources

Optical force microscopy: combining light with atomic force microscopy for nanomaterial identification

Nanophotonics, 2019
Scanning probe techniques have evolved significantly in recent years to detect surface morphology of materials down to subnanometer resolution, but without revealing spectroscopic information.
Jahan Nusrat, Wang Hanwei, Zhao Shensheng, Dutta Arkajit, Huang Hsuan-Kai, Zhao Yang, Chen Yun-Sheng   +6 more
doaj   +1 more source

Phase imaging with intermodulation atomic force microscopy

, 2009
Intermodulation atomic force microscopy (IMAFM) is a dynamic mode of atomic force microscopy (AFM) with two-tone excitation. The oscillating AFM cantilever in close proximity to a surface experiences the nonlinear tip-sample force which mixes the drive ...
Arndt C. von Bieren, Binnig, Carsten Hutter, Cleveland, Daniel Platz, David B. Haviland, Erik A. Tholén, Higgins, Hillenbrand, Hu, Hu, Jesse, Lee, Lozano, Martinez, Paulo, Platz, Preiner, Rodriguez, Sahin, Sahin, Stark, Stark   +22 more
core   +1 more source

Noncontact lateral-force gradient measurement on Si(111)-7×7 surface with small-amplitude off-resonance atomic force microscopy [PDF]

, 2009
In this work, the authors report on a quantitative investigation of lateral-force gradient and lateral force between a tungsten tip and Si(111)-(7×7) surface using combined noncontact lateral-force microscopy and scanning tunneling microscopy ...
Atabak, Mehrdad, Oral, Ahmet, Ozer, H. Ozgur, Unverdi, Ozhan, Özer, H. Özgür, Ünverdi, Özhan   +5 more
core   +3 more sources

Atomic Force Microscopy of Phytosterol Based Edible Oleogels

Gels, 2023
This work reviews the use of atomic force microscopy (AFM) as a tool to investigate oleogels of edible triglyceride oils. Specific attention is given to those oleogels based on phytosterols and their esters, a class of material the authors have studied ...
Andrew B. Matheson, Vasileios Koutsos, Stephen R. Euston, Paul S. Clegg   +3 more
doaj   +1 more source

Interaction imaging with amplitude-dependence force spectroscopy

, 2013
Knowledge of surface forces is the key to understanding a large number of processes in fields ranging from physics to material science and biology. The most common method to study surfaces is dynamic atomic force microscopy (AFM).
A San Paulo, AC Hindmarsh, AJ Katan, B Luan, BJ Albers, BV Derjaguin, D Platz, EA Tholén, F Jamitzky, FJ Giessibl, H Hölscher, H Hölscher, HJ Mamin, IN Sneddon, J Legleiter, J Melcher, J Melcher, JE Sader, JL Arlett, JP Cleveland, K Jensen, L Mininni, M Dong, M Lee, M Li, M Stark, MD LaHaye, MJ Higgins, MT Cuberes, MZ Baykara, O Sahin, O Sahin, R Garcia, R Garcia, RW Stark, S Basak, S Hu, S Hu, S Jesse, S Walheim, U Dürig, U Dürig, Y Seo   +42 more
core   +1 more source