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Avalanche Photodiodes

2021
Juan Hernández-Cordero   +1 more
openaire   +1 more source

Avalanche Photodiode (APD)

2010
This chapter contains sections titled: History Structure Characteristics Applications Related Devices This chapter contains sections titled: References ]]>
openaire   +1 more source

Single Photon Avalanche Photodiodes

Optical Fiber Communication Conference and National Fiber Optic Engineers Conference, 2009
• Performance of Geiger-mode APDs is improving rapidly ↓ • New application opportunities • Infrared SPADs - Acceptable detection efficiencies - Need lower dark count rates → higher operating temperature - Need solution for afterpulsing - Initial systems demonstrations and field ...
openaire   +1 more source

Avalanche Photodiode Simulations

2014
Process simulations of the avalanche photodiode structure are performed using the proposed processing parameters. Processing parameters are varied to find the optimal values. Breakdown voltage of the different parts of the structure is simulated in the device simulator and the maximum breakdown voltage is determined.
Knežević, Tihomir, Suligoj, Tomislav
openaire   +1 more source

AlInAsSb avalanche photodiodes on InP substrates

Applied Physics Letters, 2021
Seunghyun Lee   +2 more
exaly  

Avalanche Photodiodes

2002
Masahiro Kobayashi, Takashi Mikawa
openaire   +1 more source

Excess Noise in Silicon Avalanche Photodiodes

2006
The mean avalanche gain and the excess noise factor are important parameters characterizing the performance of an Avalanche Photodiode. These parameters vary with electric field strength and the position of the primary electron-hole pairs generated in the APD depletion layer. In the present paper, the mean avalanche gain and the excess noise properties
Kocak, FATMA, Tapan, I.
openaire   +2 more sources

Back-illuminated separate absorption and multiplication GaN avalanche photodiodes

Applied Physics Letters, 2008
C Bayram, R Mcclintock, M Razeghi
exaly  

Epitaxially-grown Ge/Si avalanche photodiodes for 1.3 μm light detection

Optics Express, 2008
G Sarid, Mike Morse, John E Bowers
exaly  

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