Barrier Height Prediction by Machine Learning Correction of Semiempirical Calculations. [PDF]
García-Andrade X +3 more
europepmc +1 more source
How Do Self-Interaction Errors Associated with Stretched Bonds Affect Barrier Height Predictions? [PDF]
Shukla PB +5 more
europepmc +1 more source
An extended grain boundary barrier height model including the impact of internal electric field
An extended phenomenological model is proposed to rationalize the potential barriers of the varistor like boundaries of piezoelectric semiconductors.
Bai-Xiang Xu +3 more
doaj +1 more source
Schottky barrier height engineering on MoS2 field-effect transistors using a polymer surface modifier on a contact electrode. [PDF]
Choi D, Jeon J, Park TE, Ju BK, Lee KY.
europepmc +1 more source
Hydraulic fracturing stands as a pivotal technological approach for enhanced tight gas recovery. This paper investigates the influences of geological and engineering parameters on the vertical extension mechanism of hydraulic fractures.
Jianshu Wu +9 more
doaj +1 more source
Correction: Controlling barrier height and spectral responsivity of p-i-n based GeSn photodetectors via arsenic incorporation. [PDF]
Nawwar MA +7 more
europepmc +1 more source
Effect of barrier height on friction behavior of the semiconductors silicon and gallium arsenide in contact with pure metals [PDF]
Friction experiments were conducted for the semiconductors silicon and gallium arsenide in contact with pure metals. Polycrystalline titanium, tantalum, nickel, palladium, and platinum were made to contact a single crystal silicon (111) surface.
Buckley, D. H., Mishina, H.
core +1 more source
Controlling barrier height and spectral responsivity of p-i-n based GeSn photodetectors via arsenic incorporation. [PDF]
Nawwar MA +7 more
europepmc +1 more source
Observations and Parameterization of the Effects of Barrier Height and Source-to-Barrier Distance on Concentrations Downwind of a Roadway. [PDF]
Francisco DM +4 more
europepmc +1 more source
Barrier inhomogeneities of Al/p-In2Te3 thin film Schottky diodes [PDF]
The current-voltage (I-V) and capacitance-voltage (C-V) characteristics of p-In2Te3/Al thin films Schottky diodes papered by Flash Evaporation technique were measured in the temperature range 303-335 K have been interpreted on the basis of the assumption
Desai, M.S. +6 more
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