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Minimizing degradation of SiC bipolar semiconductor devices
2005SUMAKERIS JOSEPH J +6 more
openaire +3 more sources
An investigation of hot electron induced degradation for silicon bipolar transistors
1992openaire +1 more source
Effects of Bipolar Degradation on SiC MOSFET Package Reliability Evaluation
2025 IEEE Energy Conversion Conference Congress and Exposition (ECCE)Yang Li +7 more
openaire +1 more source
Proton and Gamma Ray Induced Gain Degradation in Bipolar Transistor
Radiation Effects and Defects in Solids, 2003exaly

