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Degradation of bipolar transistors under high current stress at 300 K
Journal of Applied Physics, 1988G P Li, Li G P
exaly
Dead Time Dependency of Bipolar Degradation in SiC MOSFETs
2025 37th International Symposium on Power Semiconductor Devices and ICs (ISPSD)Clemens Herrmann +5 more
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New degradation mechanism associated with hydrogen in bipolar transistors under hot carrier stress
Applied Physics Letters, 1993G J Sonek, Li G P
exaly
Degradation of bipolar transistor electrical parameters during sem evaluation
Microelectronics Reliability, 1974R.L. Pease, K.F. Galloway
openaire +1 more source
Recent Progress in Modeling and Mitigation of Bipolar Degradation in 4H-SiC
2023openaire +1 more source

