Results 231 to 240 of about 27,330 (257)

Simulation of hot electron induced degradation in silicon bipolar transistors

Proceedings of the 1992 Bipolar/BiCMOS Circuits and Technology Meeting, 2003
A hot electron degradation model for bipolar transistors is presented which calculates the damage on a spatially-dependent, two-dimensional, microscopic level. The model first uses a hydrodynamic transport model to calculate the hot electron current density.
C.-J. Huang, T.A. Grotjohn, D.K. Reinhard, C.J. Sun, C.C.-W. Yu   +4 more
openaire   +1 more source

Hot-electron degradation of bipolar transistors

1995
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995. ; Includes bibliographical references (leaves 81-82). ; by Noah Zamdmer. ; M.S.
openaire   +1 more source

Hot-Carrier Degradation in Silicon-Germanium Heterojunction Bipolar Transistors

2014
While the SiGe HBT evolution has led to the significant proliferation of BiCMOS technologies and mixed-signal applications, a host of reliability issues has come to the forefront due to its suitability for multiple applications ranging from high-performance analog to millimeter-wave applications. Hot-carrier induced reliability degradation mechanism is
Partha S. Chakraborty, John D. Cressler
openaire   +1 more source

Evaluation of Bipolar Degradation in SiC MOSFETs for Converter Design

2023 IEEE Energy Conversion Congress and Exposition (ECCE), 2023
Yifei Wu, Chengxi Li, Li Ran, Qinze Cao, Peter Gammon, Hao Feng, Yun Li, Chong Ng, Binbing Wu   +8 more
openaire   +1 more source

A coupling approach between metallic bipolar plates corrosion and membrane chemical degradation in the proton exchange membrane fuel cells

International Journal of Hydrogen Energy, 2021
Bernard Normand
exaly  

New Mechanism For Bipolar Degradation In Sub-micron BiCMOS

Symposium 1993 on VLSI Technology, 1993
null Bude, null Kizilyalli
openaire   +1 more source

Impact of Active Chlorines and •OH Radicals on Degradation of Quinoline Using the Bipolar Electro-Fenton Process

Water (Switzerland), 2021
Chengxing Cui, Bingxing Wang, Ji-Chao Wang   +2 more
exaly  

Effects of constant voltage stress on bipolar degradation in 4H-SiC IGBT

Journal of Crystal Growth, 2023
Liuan Li, Ling Sang, Xiping Niu
exaly  

Pseudocapacitive Ti/RuO2-IrO2-RhOx electrodes with high bipolar stability for phenol degradation

Separation and Purification Technology, 2021
Huachang Jin, Xueming Chen
exaly  

Degradation of bipolar transistors under high current stress at 300 K

Journal of Applied Physics, 1988
Li G P
exaly