Simulation of Interference‐Enhanced Raman Amplification for Advanced Microelectronic Applications
physica status solidi (a), Volume 223, Issue 8, 22 April 2026.This work presents an open‐source tool modeling interference‐enhanced Raman intensities in any multilayered structures. Depending on the stack and laser source, constructive interferences can be exploited to improve strain or composition measurement.
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