Results 151 to 160 of about 4,271 (168)
Some of the next articles are maybe not open access.
Low-Transition Test Pattern Generation for BIST-Based Applications
IEEE Transactions on Computers, 2008exaly
LT-RTPG: a new test-per-scan BIST TPG for low switching activity
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2006exaly
M2BIST-SPNet: RUL prediction for railway signaling electromechanical devices
Journal of Supercomputingexaly

