Results 131 to 140 of about 4,503 (162)

Built-In Self-Test (BIST) Methods for MEMS: A Review

Micromachines, 2021
David Flynn, Marc Phillipe Yves Desmulliez, Gergely Hantos   +2 more
exaly  

BIST Logistics

2023
Marty Huitt, Gail Tolbert
openaire   +1 more source

TRANSPARENT BIST FOR RAMS

Proceedings International Test Conference 1992, 2005
openaire   +1 more source

On improving test quality of scan-based BIST

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2000
Cheng Tim Kwang-Ting, S Bhawmik
exaly  

A Flexible Programmable Memory BIST Architecture

IETE Journal of Education Online, 2010
Rajeevan Chandel
exaly  

Symmetry Measure for Memory Test and Its Application in BIST Optimization

Journal of Electronic Testing: Theory and Applications (JETTA), 2011
Gurgen Harutyunyan, Y Zorian
exaly  

Hybrid BIST optimization using reseeding and test set compaction

Microprocessors and Microsystems, 2008
Raimund Ubar, Gert Jervan, Helena Kruus   +2 more
exaly  

A Low-Cost Concurrent BIST Scheme for Increased Dependability

IEEE Transactions on Professional Communication, 2005
I Voyiatzis, C Halatsis
exaly  

Behavioral test generation for the selection of BIST logic

Journal of Systems Architecture, 2002
Donatella Sciuto, Franco Fummi, Fabrizio Ferrandi   +2 more
exaly  

Werde, der du bist und nicht bist

Nietzscheforschung, 2019
openaire   +1 more source