Results 41 to 50 of about 1,240,548 (287)
Bounds for the Breakdown Point of the Simplicial Median
\textit{R. Y. Liu} [Ann. Stat. 18, No. 1, 405-414 (1990; Zbl 0701.62063)] introduced the simplicial median as a generalization of the median for a multivariate probability distribution. The simplicial median is affine equivariant and so is the sample simplicial median if it is unique or if it is conveniently chosen when it is not unique.
openaire +2 more sources
To infinity and some glimpses of beyond
Certain physical problems such as the rupture of a thin sheet can be difficult to solve as computations breakdown at the point of rupture. Here the authors propose a regularization approach to overcome this breakdown which could help dealing with ...
Panayotis G. Kevrekidis +2 more
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Where does N(ε)-trimethyllysine for the carnitine biosynthesis in mammals come from? [PDF]
N(ε)-trimethyllysine (TML) is a non-protein amino acid which takes part in the biosynthesis of carnitine. In mammals, the breakdown of endogenous proteins containing TML residues is recognized as starting point for the carnitine biosynthesis.
Luigi Servillo +4 more
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Grüneisen Ratio at the Kondo-Breakdown Quantum Critical Point
We show that the scenario of multi-scale Kondo breakdown quantum critical point (QCP) gives rise to a divergent Grüneisen ratio with an anomalous exponent 0.7. In particular, we fit the experimental data of $YbRh_{2}(Si_{0.95}Ge_{0.05})_{2}$ for specific heat, thermal expansion, and Grüneisen ratio based on our simple analytic expressions. A reasonable
Kim, K. -S., Benlagra, A., Pépin, C.
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The Kondo breakdown scenario has been claimed to allow the $T$-linear resistivity in the vicinity of the Kondo breakdown quantum critical point, two cornerstones of which are the dynamical exponent $z = 3$ quantum criticality for hybridization ...
Kim, Ki-Seok
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Reliability Prediction of Highly Scaled MOSFET Devices via Fractal Structure of Spatial Defects
The needs for continuous size reduction of metal-oxide-semiconductor field effect transistor (MOSFET) devices can cause serious reliability concerns. In particular, gate oxide breakdown is a key mechanism concerning the lifetimes of MOSFET devices.
Seong-Joon Kim, Man Soo Kim, Suk Joo Bae
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The Ile181Asn variant of human UDP‐xylose synthase (hUXS1), associated with a short‐stature genetic syndrome, has previously been reported as inactive. Our findings demonstrate that Ile181Asn‐hUXS1 retains catalytic activity similar to the wild‐type but exhibits reduced stability, a looser oligomeric state, and an increased tendency to precipitate ...
Tuo Li +2 more
wiley +1 more source
Yet another breakdown point notion: EFSBP - illustrated at scale-shape models
The breakdown point in its different variants is one of the central notions to quantify the global robustness of a procedure. We propose a simple supplementary variant which is useful in situations where we have no obvious or only partial equivariance ...
A Balkema +19 more
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This paper deals with a comparative study of AC and DC breakdown voltages of based mineral oil mixtures with natural and synthetic esters mainly used in high voltage power transformers.
Abderrahmane Beroual +3 more
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Low-Area Four-Channel Controlled Dielectric Breakdown System Design for Point-of-Care Applications
In this study, we propose a low-area multi-channel controlled dielectric breakdown (CDB) system that simultaneously produces several nanopore sensors. Conventionally, solid-state nanopores are prepared by etching or drilling openings in a silicon nitride
Jonggi Hong +3 more
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