Epitaxial Mixed-Dimensional MoS<sub>2</sub> Nanofin-Nanoribbon Hybrids and Their Integration into Electronic and Optoelectronic Devices. [PDF]
Danieli Y +7 more
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An Overview of Hot Carrier Degradation on Gate-All-Around Nanosheet Transistors. [PDF]
Zhou H.
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Effect of C<sub>2</sub>H<sub>2</sub>F<sub>4</sub>/CF<sub>4</sub>O with low global warming potentials on SiN<sub>x</sub> etching as a CHF<sub>3</sub> replacement. [PDF]
Kim KL +11 more
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Reducing Off-State and Leakage Currents by Dielectric Permittivity-Graded Stacked Gate Oxides on Trigate FinFETs: A TCAD Study. [PDF]
Ülkü A +6 more
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Sub-THz communication systems: pushing the capabilities of silicon. [PDF]
Gruber J +6 more
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Enhanced CPU Design for SDN Controller. [PDF]
Bazzi HS +4 more
europepmc +1 more source
Degradation Induced by Total Ionizing Dose and Hot Carrier Injection in SOI FinFET Devices. [PDF]
Yu H +5 more
europepmc +1 more source
Carrier Mapping in Sub-2nm Node Nanosheet Transistors with Scanning Spreading Resistance Microscopy. [PDF]
Pondini A +7 more
europepmc +1 more source
An ultra energy-efficient hardware platform for neuromorphic computing enabled by 2D-TMD tunnel-FETs. [PDF]
Pal A +6 more
europepmc +1 more source
A Review of Reliability in Gate-All-Around Nanosheet Devices. [PDF]
Wang M.
europepmc +1 more source

