Results 61 to 70 of about 3,872 (182)

4H-SiC 64 pixels CMOS image sensors with 3T/4T-APS arrays

open access: yesApplied Physics Express
For radiation-hardened CMOS image sensors (CIS), 4H-SiC 64 pixel array CIS were developed, and real time imaging with an operation frequency of 30 Hz was demonstrated.
Tatsuya Meguro   +5 more
doaj   +1 more source

Smart CMOS image sensor for lightning detection and imaging [PDF]

open access: yes, 2013
We present a CMOS image sensor dedicated to lightning detection and imaging. The detector has been designed to evaluate the potentiality of an on-chip lightning detection solution based on a smart sensor.
Bréart-de-Boisanger, Michel   +12 more
core   +1 more source

Quantifying Strain and Its Effect on Charge Transport in Ge/Si Core/Shell Nanowires

open access: yesAdvanced Science, EarlyView.
This work demonstrates strain engineering in Ge/Si core–shell nanowires (CS NWs) by tuning the Ge core‐Si shell dimensions. Polarization‐resolved µ‐Raman and geometrical phase analysis quantify the resulting strain. Electronic transport measurements demonstrate record hole mobilities up to 25 400 cm2/Vs, highlighting these Ge/Si CS NWs as a promising ...
Aswathi K. Sivan   +14 more
wiley   +1 more source

Framing imaging technology for transient information detecting based on CIS

open access: yesShenzhen Daxue xuebao. Ligong ban
Microchannel plate (MCP) traveling-wave gated framing cameras are widely used for inertial confinement fusion. However, they suffer from drawbacks such as bulky size and non-single-line-of-sight imaging.
MA Youlin   +6 more
doaj   +1 more source

Design of Monolithic Bi-Layer High-Z PAL-Si Hard X-ray CMOS Image Sensors for Quantum Efficiency Enhancement

open access: yesInstruments, 2023
This article experimentally investigates the inception of an innovative hard X-ray photon energy attenuation layer (PAL) to advance high-energy X-ray detection (20–50 keV).
Eldred Lee   +5 more
doaj   +1 more source

Displacement damage effects due to neutron and proton irradiations on CMOS image sensors manufactured in deep submicron technology [PDF]

open access: yes, 2010
Displacement damage effects due to proton and neutron irradiations of CMOS image sensors dedicated to imaging are presented through the analysis of the dark current behavior in pixel arrays and isolated photodiodes. The mean dark current increase and the
Girard, Sylvain   +7 more
core   +4 more sources

Directed Evolution Improves the Catalytic Efficiency of APEX2‐Mediated Proximity‐Dependent RNA Labeling

open access: yesAdvanced Science, EarlyView.
ABSTRACT Engineered ascorbate peroxidase APEX2 has been widely used for spatially restricted profiling of subcellular biomolecules, but its catalytic efficiency toward newly developed probes such as biotin‐aniline (Btn‐An) remains suboptimal. To overcome this limitation, we performed yeast surface display‐based directed evolution to enhance APEX2 ...
Gang Wang, Yi Li, Peiyuan Meng, Peng Zou
wiley   +1 more source

Dynamic range optimisation of CMOS image sensors dedicated to space applications [PDF]

open access: yes, 2007
Nowadays, CMOS image sensors are widely considered for space applications. Their performances have been significantly enhanced with the use of CIS (CMOS Image Sensor) processes in term of dark current, quantum efficiency and conversion gain.
Boucher, Luc   +5 more
core   +1 more source

Influence of Bottom Electrodes on the Ferroelectric Stability of AlScN Film at High Temperatures

open access: yesAdvanced Electronic Materials, EarlyView.
The thermal stability of AlScN depends on the bottom electrode. When the bottom electrode possesses compressive stress, tensile strain develops in the AlScN upon thermal annealing, reducing the switching barrier. When the bottom electrode forms a coherent interface with AlScN, significant tensile strain and defects are generated in the AlScN layer ...
Kyung Do Kim   +4 more
wiley   +1 more source

Evidence of a novel source of random telegraph signal in CMOS image sensors [PDF]

open access: yes, 2011
This letter reports a new source of dark current random telegraph signal in CMOS image sensors due to meta-stable Shockley-Read-Hall generation mechanism at oxide interfaces.
Gaillardin, Marc   +4 more
core   +1 more source

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