Results 41 to 50 of about 3,872 (182)
Analysis of total dose-induced dark current in CMOS image sensors from interface state and trapped charge density measurements [PDF]
, 2010 The origin of total ionizing dose induced dark current in CMOS image sensors is investigated by comparing dark current measurements to interface state density and trapped charge density measurements.
Girard, Sylvain +4 more
core +4 more sources
Sensors, 2019 This paper presents the effects of offset pixel aperture width on the performance of monochrome (MONO) CMOS image sensors (CISs) for a three-dimensional image sensor.
Jimin Lee +8 more
doaj +1 more source
Sensors, 2020 A single-photon CMOS image sensor (CIS) design based on pinned photodiode (PPD) with multiple charge transfers and sampling is described. In the proposed pixel architecture, the photogenerated signal is sampled non-destructively multiple times and the ...
Konstantin D. Stefanov +5 more
doaj +1 more source
Research-grade CMOS image sensors for remote sensing applications [PDF]
, 2004 Imaging detectors are key elements for optical instruments and sensors on board space missions dedicated to Earth observation (high resolution imaging, atmosphere spectroscopy...), Solar System exploration (micro cameras, guidance for autonomous vehicle.
Belliot, Pierre +8 more
core +1 more source
Single Event Effects in CMOS Image Sensors [PDF]
, 2012 In this work, 3T Active Pixel Sensors (APS) are exposed to heavy ions (N, Ar, Kr, Xe), and Single Event Effects (SEE) are studied. Devices were fully functional during exposure, no Single Event Latch-up (SEL) or Single Event Functional Interrupt (SEFI ...
Goiffon, Vincent +4 more
core +2 more sources
Rad Tolerant CMOS Image Sensor Based on Hole Collection 4T Pixel Pinned Photodiode [PDF]
, 2012 1.4μm pixel pitch CMOS Image sensors based on hole collection pinned photodiode (HPD) have been irradiated with 60Co source. The HPD sensors exhibit much lower dark current degradation than equivalent commercial sensors using an Electron collection ...
Allegret, Stephane +5 more
core +1 more source
Study on Color Information Degradation Induced by γ-ray Radiation in CMOS Cameras
Yuanzineng kexue jishu, 2023 The γ-rays are widely and abundantly present in strong nuclear radiation environments, and when they act on the camera equipment used to obtain environmental visual information on nuclear robots, radiation effects will occur, which will degrade the ...
LI Kunfang1,2,3;FENG Jie1,2,*;WANG Haichuan1,2;LI Yudong1,2,*;WEN Lin1,2;LI Zhenzhe4;GUO Qi1,2
doaj +1 more source
CMOS detectors for space applications: from R&D to operational program with large volume foundry [PDF]
, 2010 Nowadays, CMOS image sensors are widely considered for space applications. The use of CIS (CMOS Image sensor) processes has significantly enhanced their performances such as dark current, quantum efficiency and conversion gain.
Breart de Boisanger, Michel +6 more
core +1 more source
Compressive Imaging Using RIP-Compliant CMOS Imager Architecture and Landweber Reconstruction [PDF]
, 2020 In this paper, we present a new image sensor architecture for fast and accurate compressive sensing (CS) of natural images. Measurement matrices usually employed in CS CMOS image sensors are recursive pseudo-random binary matrices.
Akbari, Ali +4 more
core +1 more source
A Low-Power CMOS Image Sensor With Multiple-Column-Parallel Readout Structure
IEEE Journal of the Electron Devices Society, 2022 This paper presents a low-power multiple-column-parallel (MCP) readout CMOS image sensor (CIS) in terms of its structural features. Because each column in an MCP unit performs analog-to-digital (A/D) conversion sequentially, the columns have their own ...
Jang-Su Hyeon +2 more
doaj +1 more source