Results 31 to 40 of about 49,365 (285)

Performance and Reliability Degradation of CMOS Image Sensors in Back-Side Illuminated Configuration

open access: yesIEEE Journal of the Electron Devices Society, 2020
We present a systematic characterization of wafer-level reliability dedicated test structures in Back-Side-Illuminated CMOS Image Sensors. Noise and electrical measurements performed at different steps of the fabrication process flow, definitely ...
Andrea Vici   +5 more
doaj   +1 more source

Displacement damage effects due to neutron and proton irradiations on CMOS image sensors manufactured in deep submicron technology [PDF]

open access: yes, 2010
Displacement damage effects due to proton and neutron irradiations of CMOS image sensors dedicated to imaging are presented through the analysis of the dark current behavior in pixel arrays and isolated photodiodes. The mean dark current increase and the
Girard, Sylvain   +7 more
core   +4 more sources

Development of a Charge-Multiplication CMOS Image Sensor Based on Capacitive Trench for Low-Light-Level Imaging

open access: yesSensors, 2023
This paper presents an electron multiplication charge coupled device (EMCCD) based on capacitive deep trench isolation (CDTI) and developed using complementary metal oxide semiconductor (CMOS) technology.
Olivier Marcelot   +7 more
doaj   +1 more source

Rad Tolerant CMOS Image Sensor Based on Hole Collection 4T Pixel Pinned Photodiode [PDF]

open access: yes, 2012
1.4μm pixel pitch CMOS Image sensors based on hole collection pinned photodiode (HPD) have been irradiated with 60Co source. The HPD sensors exhibit much lower dark current degradation than equivalent commercial sensors using an Electron collection ...
Allegret, Stephane   +5 more
core   +1 more source

A 12-Bit High-Speed Column-Parallel Two-Step Single-Slope Analog-to-Digital Converter (ADC) for CMOS Image Sensors

open access: yesSensors, 2014
A 12-bit high-speed column-parallel two-step single-slope (SS) analog-to-digital converter (ADC) for CMOS image sensors is proposed. The proposed ADC employs a single ramp voltage and multiple reference voltages, and the conversion is divided into coarse
Tao Lyu   +3 more
doaj   +1 more source

CMOS sensors for atmospheric imaging [PDF]

open access: yesInternational Conference on Space Optics — ICSO 2016, 2017
Recent European atmospheric imaging missions have seen a move towards the use of CMOS sensors for the visible and NIR parts of the spectrum. These applications have particular challenges that are completely different to those that have driven the development of commercial sensors for applications such as cell-phone or SLR cameras. This paper will cover
Wendy Hubbard   +7 more
openaire   +1 more source

Super Field-of-View Lensless Camera by Coded Image Sensors

open access: yesSensors, 2019
A lensless camera is an ultra-thin computational-imaging system. Existing lensless cameras are based on the axial arrangement of an image sensor and a coding mask, and therefore, the back side of the image sensor cannot be captured.
Tomoya Nakamura   +3 more
doaj   +1 more source

Analysis of total dose-induced dark current in CMOS image sensors from interface state and trapped charge density measurements [PDF]

open access: yes, 2010
The origin of total ionizing dose induced dark current in CMOS image sensors is investigated by comparing dark current measurements to interface state density and trapped charge density measurements.
Girard, Sylvain   +4 more
core   +4 more sources

CMOS Cell Sensors for Point-of-Care Diagnostics

open access: yesSensors, 2012
The burden of health-care related services in a global era with continuously increasing population and inefficient dissipation of the resources requires effective solutions. From this perspective, point-of-care diagnostics is a demanded field in clinics.
Haluk Kulah, Yekbun Adiguzel
doaj   +1 more source

Novel readout circuit architecture for CMOS image sensors minimizing RTS noise [PDF]

open access: yes, 2011
This letter presents a novel readout architecture and its associated readout sequence for complementary metal–oxide– semiconductor (CMOS) image sensors (CISs) based on switch biasing techniques in order to reduce noisy pixel numbers induced by in-pixel
Magnan, Pierre   +1 more
core   +1 more source

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