Results 21 to 30 of about 49,708 (287)

Gamma-ray irradiation tests of CMOS sensors used in imaging techniques [PDF]

open access: yesNuclear Technology and Radiation Protection, 2014
Technologically-enhanced electronic image sensors are used in various fields as diagnostic techniques in medicine or space applications. In the latter case the devices can be exposed to intense radiation fluxes over time which may impair the ...
Cappello Salvatore G.   +4 more
doaj   +1 more source

Ultra-high-resolution quanta image sensor with reliable photon-number-resolving and high dynamic range capabilities

open access: yesScientific Reports, 2022
Superior low-light and high dynamic range (HDR) imaging performance with ultra-high pixel resolution are widely sought after in the imaging world. The quanta image sensor (QIS) concept was proposed in 2005 as the next paradigm in solid-state image ...
Jiaju Ma   +4 more
doaj   +1 more source

CMOS Depth Image Sensor with Offset Pixel Aperture Using a Back-Side Illumination Structure for Improving Disparity

open access: yesSensors, 2020
This paper presents a CMOS depth image sensor with offset pixel aperture (OPA) using a back-side illumination structure to improve disparity. The OPA method is an efficient way to obtain depth information with a single image sensor without additional ...
Jimin Lee   +7 more
doaj   +1 more source

High performances monolithic CMOS detectors for space applications [PDF]

open access: yes, 2001
During the last 10 years, research about CMOS image sensors (also called APS -Active Pixel Sensors) has been intensively carried out, in order to offer an alternative to CCDs as image sensors.
Corbière, Franck   +8 more
core   +1 more source

Analysis of the Interference Effects in CMOS Image Sensors Caused by Strong Electromagnetic Pulses [PDF]

open access: yesJournal of Electromagnetic Engineering and Science
With the electromagnetic environment becoming increasingly complex, it is crucial to address the risk posed by electromagnetic pulse, which critically impairs the performance and reliability of electronic systems based on complementary metal oxide ...
Zhikang Yang   +9 more
doaj   +1 more source

Silicon Wafer Gettering Design for Advanced CMOS Image Sensors Using Hydrocarbon Molecular Ion Implantation: A Review

open access: yesIEEE Journal of the Electron Devices Society, 2022
We have developed silicon epitaxial wafers with high gettering capability using hydrocarbon molecular ion implantation for advanced Complementary Metal-Oxide-Semiconductor (CMOS) image sensors. These wafers have three unique silicon wafer characteristics
Kazunari Kurita   +9 more
doaj   +1 more source

Space optical instruments optimisation thanks to CMOS image sensor technology [PDF]

open access: yes, 2005
Today, both CCD and CMOS sensors can be envisaged for nearly all visible sensors and instruments designed for space needs. Indeed, detectors built with both technologies allow excellent electro-optics performances to be reached, the selection of the most
Corbière, Franck   +7 more
core   +1 more source

Research-grade CMOS image sensors for remote sensing applications [PDF]

open access: yes, 2004
Imaging detectors are key elements for optical instruments and sensors on board space missions dedicated to Earth observation (high resolution imaging, atmosphere spectroscopy...), Solar System exploration (micro cameras, guidance for autonomous vehicle.
Belliot, Pierre   +8 more
core   +1 more source

Rad Tolerant CMOS Image Sensor Based on Hole Collection 4T Pixel Pinned Photodiode [PDF]

open access: yes, 2012
1.4μm pixel pitch CMOS Image sensors based on hole collection pinned photodiode (HPD) have been irradiated with 60Co source. The HPD sensors exhibit much lower dark current degradation than equivalent commercial sensors using an Electron collection ...
Allegret, Stephane   +5 more
core   +1 more source

Performance and Reliability Degradation of CMOS Image Sensors in Back-Side Illuminated Configuration

open access: yesIEEE Journal of the Electron Devices Society, 2020
We present a systematic characterization of wafer-level reliability dedicated test structures in Back-Side-Illuminated CMOS Image Sensors. Noise and electrical measurements performed at different steps of the fabrication process flow, definitely ...
Andrea Vici   +5 more
doaj   +1 more source

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