Results 271 to 280 of about 14,487,149 (305)
Some of the next articles are maybe not open access.
2007
As the mainstream MOS technology is scaled into the deep sub-micron regime, development of a truly physical and predictive compact model for circuit simulation that covers geometry, bias, temperature, d.c.. a.c., RF, and noise characteristics becomes a major challenge.
openaire +1 more source
As the mainstream MOS technology is scaled into the deep sub-micron regime, development of a truly physical and predictive compact model for circuit simulation that covers geometry, bias, temperature, d.c.. a.c., RF, and noise characteristics becomes a major challenge.
openaire +1 more source
Compact modeling of variational waveforms
2007 IEEE/ACM International Conference on Computer-Aided Design, 2007Vladimir Zolotov +4 more
openaire +1 more source
Continuous and symmetric trans-capacitance compact model for triple-gate junctionless MOSFETs
Solid-State Electronics, 2021Gérard Ghibaudo, C A Dimitriadis
exaly
A Dynamical Compact Model of Diffusive and Drift Memristors for Neuromorphic Computing
Advanced Electronic Materials, 2022J Joshua Yang, Wenhao Song, Ye Zhuo
exaly
1993
Linear fractional models emerged in the last chapter as tools for determining the cyclic behavior of composition operators. In this one they figure in the study of compactness. Recall from §5.5 that a necessary (but by no means sufficient) condition for a composition operator to be compact is that its inducing map have a fixed point in U.
openaire +1 more source
Linear fractional models emerged in the last chapter as tools for determining the cyclic behavior of composition operators. In this one they figure in the study of compactness. Recall from §5.5 that a necessary (but by no means sufficient) condition for a composition operator to be compact is that its inducing map have a fixed point in U.
openaire +1 more source
Circuit-Based Compact Model of Electron Spin Qubit
Electronics (Switzerland), 2022Mattia Borgarino
exaly
Modeling and simulation compact models
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest., 2006K. Joardar, null Jeong-Taek Kong
openaire +1 more source

