Results 1 to 10 of about 171,184 (117)

On the Modeling of the Donor/Acceptor Compensation Ratio in Carbon-Doped GaN to Univocally Reproduce Breakdown Voltage and Current Collapse in Lateral GaN Power HEMTs [PDF]

open access: yesMicromachines, 2021
The intentional doping of lateral GaN power high electron mobility transistors (HEMTs) with carbon (C) impurities is a common technique to reduce buffer conductivity and increase breakdown voltage.
Nicolò Zagni   +4 more
doaj   +2 more sources

Improved Comprehensive Performance of GaN-Based E-Mode HEMTs with a Thin Al2O3 Interlayer [PDF]

open access: yesNanomaterials
In this paper, a 2.5 nm thick Al2O3 interlayer deposited by atomic layer deposition was inserted between AlGaN/GaN HEMT structure and SiNx passivation layer to reduce interface damage of the semiconductor/dielectric introduced directly by plasma-enhanced
Guang Qiao   +7 more
doaj   +2 more sources

Gravitational Waves from Gravitational Collapse

open access: yesLiving Reviews in Relativity, 2003
Gravitational wave emission from the gravitational collapse of massive stars has been studied for more than three decades. Current state-of-the-art numerical investigations of collapse include those that use progenitors with more realistic angular ...
Chris Fryer
exaly   +2 more sources

Transient Analysis of Donor-like Surface Traps in GaN HEMTs [PDF]

open access: yesAUT Journal of Electrical Engineering, 2022
Charge trapping in Gallium Nitride-based devices affect their reliability and performance. In this paper, we study the dynamics of charge capture and emission in donor-like surface traps, and the impact of trapped charges on transient response of the ...
Amirali Chalechale   +2 more
doaj   +1 more source

Modeling the Effects of Threading Dislocations on Current in AlGaN/GaN HEMT

open access: yesMicromachines, 2023
The aim of this paper is to model the effects of threading dislocations on both gate and drain currents of AlGaN/GaN high electron mobility transistors (HEMTs).
Censong Liu   +4 more
doaj   +1 more source

An Overview on Analyses and Suppression Methods of Trapping Effects in AlGaN/GaN HEMTs

open access: yesIEEE Access, 2022
Due to the excellent material characteristics, AlGaN/GaN HEMTs are widely used in high power and high frequency applications. However, the existence of damages, defects and dislocations still degrade the device features because of trapping effects.
Ran Ye   +6 more
doaj   +1 more source

Effective Suppression of Current Collapse in AlGaN/GaN HEMT With N2O Plasma Treatment Followed by High Temperature Annealing in N2 Ambience

open access: yesIEEE Journal of the Electron Devices Society, 2022
We propose a high temperature annealing process in N2 ambience after N2O plasma treatment for AlGaN/GaN HEMT. The annealing process effectively improves the plasma treated surface condition and decreases the current collapse from 41.7% to 10.6 ...
Jingxiong Chen   +3 more
doaj   +1 more source

Simulation of High Breakdown Voltage, Improved Current Collapse Suppression, and Enhanced Frequency Response AlGaN/GaN HEMT Using A Double Floating Field Plate

open access: yesCrystals, 2023
In this paper, DC, transient, and RF performances among AlGaN/GaN HEMTs with a no field plate structure (basic), a conventional gate field plate structure (GFP), and a double floating field plate structure (2FFP) were studied by utilizing SILVACO ATLAS ...
Peiran Wang   +9 more
doaj   +1 more source

Temperature-Independent Current Dispersion in 0.15 μm AlGaN/GaN HEMTs for 5G Applications

open access: yesMicromachines, 2022
Thanks to high-current densities and cutoff frequencies, short-channel length AlGaN/GaN HEMTs are a promising technology solution for implementing RF power amplifiers in 5G front-end modules. These devices, however, might suffer from current collapse due
Nicolò Zagni   +2 more
doaj   +1 more source

Suppression of hot electron effect in AlGaN/GaN HEMT with multi-grooves barrier-etched structure

open access: yesMaterials Research Express, 2023
A multi-grooves barrier-etched structure between barrier layer and passivation layer is proposed in this paper to suppress the hot electron effect at the gate edge on the drain side in the p-GaN gate AlGaN/GaN high-electron-mobility transistor.
Xuanlin Li, Jie Xu, Weijing Liu
doaj   +1 more source

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