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A Survey of Detection Methods for Die Attachment and Wire Bonding Defects in Integrated Circuit Manufacturing [PDF]

open access: greenIEEE Access, 2022
Defect detection plays a vital role in the manufacturing process of integrated circuits (ICs). Die attachment and wire bonding are two steps of the manufacturing process that determine the power and signal transmission quality and dependability in an IC.
Lamia Alam, Nasser Kehtarnavaz
doaj   +6 more sources

Generating Defective Epoxy Drop Images for Die Attachment in Integrated Circuit Manufacturing via Enhanced Loss Function CycleGAN [PDF]

open access: goldSensors, 2023
In integrated circuit manufacturing, defects in epoxy drops for die attachments are required to be identified during production. Modern identification techniques based on vision-based deep neural networks require the availability of a very large number ...
Lamia Alam, Nasser Kehtarnavaz
doaj   +4 more sources

Automatic Integrated Circuit Die Positioning in the Scanning Electron Microscope [PDF]

open access: bronzeScanning, 2002
AbstractIn scanning electron microscope (SEM)‐based integrated circuit (IC) failure analysis, there is often a need for manual location of a prespecified failure site in several ICs. Such a procedure is both tedious and time consuming. This paper presents a new vision‐based die positioning system that can automatically locate a specified failure site ...
Hong Tan, J.C.H. Phang, John T. L. Thong
openalex   +4 more sources

Differential Temperature Sensors: Review of Applications in the Test and Characterization of Circuits, Usage and Design Methodology [PDF]

open access: yesSensors, 2019
Differential temperature sensors can be placed in integrated circuits to extract a signature of the power dissipated by the adjacent circuit blocks built in the same silicon die.
Enrique Barajas   +3 more
doaj   +4 more sources

BIST Method for Die-Level Process Parameter Variation Monitoring in Analog/Mixed-Signal Integrated Circuits [PDF]

open access: green2007 Design, Automation & Test in Europe Conference & Exhibition, 2007
Peer ...
Amir Zjajo   +2 more
openalex   +6 more sources

An On-Chip Balun Using Planar Spiral Inductors Based on Glass Wafer-Level IPD Technology [PDF]

open access: yesMicromachines
As integrated electronic microsystems advance, their internal components demonstrate increasing miniaturization, higher-density integration, and, consequently, significantly enhanced performance. This paper presents an on-chip transformer balun.
Jiang Qian   +6 more
doaj   +2 more sources

Simple integrated circuit reverse-engineering with deep learning: A proof of concept for automating die-polygon-capturing

open access: hybridExpert Systems with Applications
The purpose of this research is to demonstrate the feasibility of automating ‘die-polygon-capturing’, an economical yet still labor-intensive technique for circuit extraction during the reverse-engineering of simple integrated circuits. As microchip designs become increasingly diverse with the ongoing trend of using application-specific integrated ...
Quint van der Linden   +3 more
openalex   +2 more sources

13 μm InAs/GaAs quantum dot DFB laser integrated on a Si waveguide circuit by means of adhesive die-to-wafer bonding

open access: goldOptics Express, 2018
In this paper we report a single mode InAs/GaAs quantum dot distributed feedback laser at 1.3 μm wavelength heterogeneously integrated on a Si photonics waveguide circuit. Single mode lasing around 1300 nm with a side-mode suppression ratio higher than 40 dB is demonstrated. High temperature operation with continuous wave lasing up to 100°C is obtained.
Sarah Uvin   +9 more
openalex   +5 more sources

Event driven neural network on a mixed signal neuromorphic processor for EEG based epileptic seizure detection [PDF]

open access: yesScientific Reports
Long-term monitoring of biomedical signals is essential for the modern clinical management of neurological conditions such as epilepsy. However, developing wearable systems that are able to monitor, analyze, and detect epileptic seizures with long ...
Jim Bartels   +6 more
doaj   +2 more sources

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