Results 101 to 110 of about 55,611 (129)
On DLTS Experiments with Extended Defects [PDF]
Acta Physica Polonica A, 1991 openaire +1 more source
Some of the next articles are maybe not open access.
Related searches:
Related searches:
SSRN Electronic Journal, 2022
This paper provides an overview of the distributed ledger technology (DLT) options available to central banks for issuing central bank digital currency (CBDC). We discuss the main requirements that a DLT solution must fulfill and analyze the various structures for implementation offered by DLT - public, permissioned and private - and the implications ...
Guo, Sky, Kreitem, Joseph, Moser, Thomas
openaire +2 more sources
This paper provides an overview of the distributed ledger technology (DLT) options available to central banks for issuing central bank digital currency (CBDC). We discuss the main requirements that a DLT solution must fulfill and analyze the various structures for implementation offered by DLT - public, permissioned and private - and the implications ...
Guo, Sky, Kreitem, Joseph, Moser, Thomas
openaire +2 more sources
Note on the Analysis of DLTS and C2-DLTS
Japanese Journal of Applied Physics, 1982The difference in the peak temperatures of DLTS and C2-DLTS is discussed with reference to the measurement of deep levels in semiconductors. The emission rate of a trap level can be accurately determined when the peak temperature observed in DLTS agrees with that in C2-DLTS. When the peak temperatures disagree, the trap depth and trap density cannot
Hajime Tomokage +2 more
openaire +2 more sources
DLTS of gold impurities in germanium [PDF]
Semiconductor Science and Technology, 1987 The band-gap levels introduced by gold in germanium have been investigated using DLTS. The samples were taken from well characterised n- and p-type germanium crystals and were doped with gold by diffusion at 700 degrees C followed by a quench to room temperature.
E Simoen +3 more
openaire +1 more source
Physica B: Condensed Matter, 2007
This paper recalls the events leading up to the author's 1973 discovery of Deep Level Transient Spectroscopy (DLTS). It discusses the status of junction capacitance techniques in the late 1960s and points out why the typical capacitance instrumentation of that era would not have lead the author to the DLTS discovery.
David V. Lang, David V. Lang
openaire +2 more sources
This paper recalls the events leading up to the author's 1973 discovery of Deep Level Transient Spectroscopy (DLTS). It discusses the status of junction capacitance techniques in the late 1960s and points out why the typical capacitance instrumentation of that era would not have lead the author to the DLTS discovery.
David V. Lang, David V. Lang
openaire +2 more sources
Acta Physica Academiae Scientiarum Hungaricae, 1980 A method and an apparatus used for measuring of the deep level content of semiconducting crystals are described. The investigation is based on the observation of capacitance (voltage) relaxation of diodes. The evaluation of the relaxation curve is the same as proposed first byLang [1], the so-called DLTS (deep level transient spectroscopy) method.
openaire +1 more source
Integrated DLT and non-DLT system design for central bank digital currency
Proceedings of the 5th International Conference on Sustainable Information Engineering and Technology, 2020Central Bank Digital Currency (CBDC) is gaining popularity due to its potential benefit. However, experiments to explore the Distributed Ledger Technology (DLT) based CBDC is mostly done in the wholesale area, not in the retail area which has more impact on the public.
Setiadi Yazid, Danarto Tri Sasongko
openaire +2 more sources
Characterization of Deep Levels in AlGaN|GaN HEMT by FT-DLTS and Current DLTS
Semiconductors, 2020In this work, GaN|AlGaN high electron mobility transistor (HEMT) structures are investigated, grown on semi-insulating SiC substrates by molecular beam epitaxy and metal–organic chemical-vapor deposition techniques. This paper reports on the kink effect and hysteresis effect observed in AlGaN|GaN high electron mobility transistors (HEMTs) on SiC ...
M. Gassoumi, M. Gassoumi
openaire +2 more sources
A Modulated DLTS Method for Large Signal Analysis (C2-DLTS)
Japanese Journal of Applied Physics, 1981For the analysis of deep-level parameters in semiconductors, a new DLTS (Deep-Level Transient Spectroscopy) method has been proposed, in which a squaring device for the capacitance-signal processing is used with the conventional DLTS system. This method (C2-DLTS) is simple and is especially effective in the precise analysis of large signals due to ...
Yozo Tokumaru, Hideyo Okushi
openaire +2 more sources
Isothermal frequency scan DLTS
physica status solidi (a), 1986Le mode de balayage isotherme, appele mode de balayage en frequence, presente plusieurs avantages sur le mode de balayage de la temperature.
G. Ferenczi, Janos Boda, T. Pavelka
openaire +2 more sources