Results 41 to 50 of about 643 (201)
Efficient Transient Electrothermal Simulation of CMOS VLSI Circuits under Electrical Overstress
Accurate simulation of transient device thermal behavior is essential to predict CMOS VLSI circuit failures under electrical overstress (EOS). In this paper, we present an efficient transient electrothermal simulator that is built upon a SPICE-like ...
Sung-Mo (Steve) Kang +3 more
core +1 more source
S.374-380For the first time this correlation study compares air discharge CDM and contact-mode Capacitively Coupled Transmission Line Pulsing (CC-TLP) for a large chip-on-flex assembly e.g. for the Internet of Things (IOT) applications.
Gieser, Horst +4 more
core +1 more source
ABSTRACT Circular product design (CPD) is central to advancing the circular economy by enabling the narrowing, slowing, and closing of resource flows. Yet, its implementation remains persistently challenging for firms. Prior research has largely framed these challenges as discrete barriers, overlooking the structural contradictions embedded in CPD ...
Vanessa Robertson +2 more
wiley +1 more source
Electromagnetic influences and pulsing hardness of integrated circuits
The results of the single pulsing electrical overstress (EOS) series with energy below the threshold of failure for modern submicron IC’s design are presented. The study was conducted on two types of modern sub-micron VLSI.
Petr Konstantinovich Skorobogatov +3 more
doaj
The purpose of this work is to analyze and evaluate the unmanned vehicle modules sensitivity operating in a smart-city system to the intentional electromagnetic interference.
Aleksandr N. Shemonaev +3 more
doaj +1 more source
In the last years the gate-oxide overstress has become a great concern for CMOS circuits and even more so for circuits such as charge pumps. A new charge pump circuit that overcomes the gate-oxide overstress problem and has improved efficiency is ...
Cruz C.A.M., Mognon V.R., Filho C.A.R.
core +1 more source
Using CC-TLP to get a CDM robustness value
S.205-214Charged Device Model (CDM) like stress represents the highest ESD risk during handling of single devices. Today air discharge compromises repeatability of CDM tests of products in a package.
Gieser, H. +5 more
core +1 more source
ABSTRACT Small cultural museums play an important role in sustaining local heritage, community identity and inclusive cultural participation, yet they face persistent financial and organisational constraints. This study examines how financial sustainability is achieved and maintained in three small cultural museums through a qualitative‐led mixed ...
Joseph Gerald Bourke +3 more
wiley +1 more source
This paper presents fully integrated two-phase dual rails charge pump designs generating Vin_cp and Vss_cp, which are ~100 mV-150 mV above and below supply rail Vin and ground rail Vss, respectively.
Huanhuan Zhang +4 more
doaj +1 more source
ABSTRACT Some consumers exhibit aversion toward artificial intelligence (AI), particularly when it is embedded in persuasive marketing communication (MarCom). Here, we developed and validated a measure of consumer aversion to AI in MarCom and examined its downstream consequences for brand perceptions and purchase intention.
Louvins Pierre +2 more
wiley +1 more source

