Results 21 to 30 of about 643 (201)
Investigating the CDM susceptibility of ICs at package and wafer level by capacitive coupled TLP
297303The method of the Capacitive Coupled Transmission Line Pulsing (CC-TLP) is applied to a product IC at package level and for the first time at wafer level. The investigated product showed a field failure which could be reproduced by the CDM.
Gieser, H., Walter, D., Wolf, H.
core +1 more source
Relations between system level ESD and (vf-)TLP
136143This paper shows that device robustness for system level ESD scales linearly with device width. Relations between system level failure voltages and TLP failure currents are established. Most compound structures follow the same relations.
Zwol, J. van +4 more
core +1 more source
Additive effects under the series of EOS in space application VLSI circuits
One of the problems of space technology is the spacecraft on orbit charging effect. Series of EOS (electrical overstress) are caused by internal charging affect VLSI (very large-scale integrated) circuits, which may lead to its damage. The results of the
Diatlov Nikolai +2 more
doaj +1 more source
Analysis and compact modeling of lateral DMOS power devices under ESD stress conditions
S.1 ...
Mettler, S. +5 more
core +1 more source
Transient analysis of ESD protection elements by time domain transmission using repetitive pulses
304310This paper describes a test method which allows the investigation of the transient switching behavior of ESD-protection elements with very high transient resolution within the first nanoseconds.
Gieser, H. +5 more
core +1 more source
Influence of tester parasitics on "charged devive model"-failure thresholds
S.69-84The weak correlation betweeen Charged Device Model (CDM) testers may be attributed to calibration problems and the complex system interaction between tester and device for ultra-fast high-current transients.
Gieser, H.A., Egger, P.
core
Precision Lignocellulosic Biorefinery: Process Regulation From Corn Stover to Products
This study presents a precision biorefinery framework that transforms corn stover into high‐value bioproducts through whole‐process regulation. Mechanical fractionation separates feedstock into parenchyma‐rich short fibers and vascular‐bundle‐dominant long fibers.
Xue‐Cheng Lin +4 more
wiley +1 more source
A New, Single Diode, Sequential Switching Shunt Regulator
This paper describes the design improvement of a Sequential Shunt Switching Regulator (S3R) based on a power cell composed of one switching FET and one Diode connecting the Solar Array (SA) section to the Main Bus.
Gianninoto G., Scorzafava E., Carlani D.
doaj +1 more source

