Results 1 to 10 of about 643 (201)
Electrical Parameters Characterization of Aged IGBTs by Thermo-Electrical Overstress [PDF]
IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society, 2018 During their lifetime, power semiconductor devices such as Insulated Gate Bipolar Transistors (IGBTs) can suffer from different failure mechanisms. This paper reports the monitored changes in the electrical parameters of tested IGBTs when subjected to ...
Dawson, John Frederick +3 more
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Engineering and Applied Science Research, 2017 Electrostatic Discharge (ESD), Electrical Overstress (EOS) and electromagnetic compatibility (EMC) continue to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics.
Steven H. Voldman
doaj +2 more sources
CNN-LSTM-Based Prognostics of Bidirectional Converters for Electric Vehicles’ Machine [PDF]
Sensors, 2021 This paper proposes an approach to estimate the state of health of DC-DC converters that feed the electrical system of an electric vehicle. They have an important role in providing a smooth and rectified DC voltage to the electric machine.
Gabriel Rojas-Dueñas +2 more
doaj +2 more sources
GaneStat-A comprehensive design and modular analysis of portable, low-cost, and high-accuracy potentiostat. [PDF]
PLoS ONEElectrochemical research has been developing with the advancement of laboratory equipment and sophisticated technologies. One of which is the portable potentiostat, which has been utilized to analyze various samples and help characterize their ...
Isa Anshori +9 more
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Switching Parameters Characterization of Aged IGBTs by Thermo-Electrical Overstress [PDF]
IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society, 2019 This paper presents an experimental study and reports the monitored changes in the switching parameters (quoted in datasheets) of Insulated Gate Bipolar Transistors (IGBTs) when subjected to accelerated ageing through thermo-electrical overstress.
Dawson, John Frederick, Dimech, Evan
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Electrical overstress failure in silicon solar cells [PDF]
, 1982 A solar-cell electrical-overstress-failure model and the results of experimental measurements of threshold pulsed failure currents on four types of silicon solar cells are presented.
Vulliet, W. V. +4 more
core +3 more sources
Analysis of Electrical Overstress Failures
Microelectronics Reliability, 1973 Electrical overstress microcircuit failures are a major cause of equipment malfunction. Visual cues for bidentifying overstress failures are discussed. In addition means for determining the current, voltage and pulse width magnitudes of the transient pulse which caused the failure are explained.
Jack S. Smith
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Electrical overstress in AlGaN/GaN HEMTs: study of degradation processes
Solid-State Electronics, 2004 We study degradation mechanisms in 50 mum gate width/0.45 mum length AlGaN/GaN HEMTs after electrical overstresses. One hundred nanosecond long rectangular current pulses are applied on the drain contact keeping either both of the source and gate ...
D Pogány, E Gornik
exaly +2 more sources
Accelerated Aging with Electrical Overstress and Prognostics for Power MOSFETs [PDF]
IEEE 2011 EnergyTech, 2011 Power electronics play an increasingly important role in energy applications as part of their power converter circuits. Understanding the behavior of these devices, especially their failure modes as they age with nominal usage or sudden fault development
Celaya, Jose Ramon +4 more
core +2 more sources