Results 251 to 260 of about 31,810 (274)

Multivariate statistical approach to electron backscattered diffraction

Ultramicroscopy, 2008
This paper assesses the potential of multivariate statistical analysis (MSA) applied to electron backscattered diffraction (EBSD) data. Instead of directly indexing EBSD patterns on an individual basis, this multivariate approach reduces a large (thousands) set of individual EBSD patterns into a core set of statistically derived component EBSD patterns
Luke N, Brewer, Paul G, Kotula, Joseph R, Michael   +2 more
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Quantitative metallography by electron backscattered diffraction

Journal of Microscopy, 1999
Although electron backscattered diffraction (EBSD) in the scanning electron microscope is used mainly to investigate the relationship between local textures and microstructures, the technique has now developed to the stage where it requires serious consideration as a tool for routine quantitative characterization of microstructures. This paper examines
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Electron backscatter diffraction and cracking

Materials Science and Technology, 2002
Abstract Electron backscatter diffraction (EBSD) is now a well developed technique that allows for determination of 'microtexture', i.e. texture at the scale of the grain size. The effect of the local crystallographic properties on microscopic and macroscopic cracking resistance was studied in a large number of materials.
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Electron Backscatter Diffraction

2018
Electron backscatter diffraction patterns (EBSD patterns) can be used to determine the orientation of the crystal lattice. Principle of EBSD pattern is similar to Kikuchi pattern observed in transmission electron microscope (TEM). In the case of scanning electron microscope (SEM), when an electron beam enters a highly tilted crystalline material, it is
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Strain Determination Using Electron Backscatter Diffraction

AIP Conference Proceedings, 2010
In the present paper we demonstrate the use of electron backscatter diffraction (EBSD) for high resolution elastic strain determination. Here, we focus on analysis methods based on determination of small shifts in EBSD pattern with respect to a reference pattern using cross‐correlation algorithms.
M. Krause, A. Graff, F. Altmann, Ehrenfried Zschech, Shinichi Ogawa, Paul S. Ho   +5 more
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Representation of electron backscatter diffraction data

Materials Science and Technology, 1996
AbstractCurrent methods of data representation for electron backscatter diffraction (EBSD) measurements are reviewed. Obtaining diffraction data from microstructures using EBSD has become a relatively straightforward procedure, and EBSD software packages are used to represent these data as qualitative statistics in the form of ideal orientations, pole ...
V. Randle, M. Caul
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Electron backscatter diffraction beyond the mainstream

Crystal Research and Technology, 2016
We present special applications of electron backscatter diffraction (EBSD) which aim to overcome some of the limitations of this technique as it is currently applied in the scanning electron microscope. We stress that the raw EBSD signal carries additional information which is useful beyond the conventional orientation determination.
Gert Nolze, Ralf Hielscher, Aimo Winkelmann   +2 more
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Electron Backscatter Diffraction (EBSD)

2018
In the field of heritage studies, a variety of materials may be encountered in different studies concerning art objects, monuments and artifacts in general. Glass, stone, ceramic, mortar, and metal are only a few examples of materials (or part of them) that can have a crystalline nature, matching the basic condition for being analyzed by electron ...
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Metallographic Preparation for Electron Backscattered Diffraction

Materials Science Forum, 2011
Electron Backscatter Diffraction measurement can provide much analytical information, such as the phase orientation or material identification. The “Quality” rating of the backscatter diffraction depends on the success rate of indexing. To achieve this, a deformation-free preparation is essential.
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Electron Backscatter Diffraction: Operation and Applications

Microscopy and Microanalysis, 2008
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7 ...
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