Results 21 to 30 of about 4,399 (209)

Off-axis electron holography for the direct visualization of perpendicular shape anisotropy in nanoscale 3D magnetic random-access-memory devices

open access: yesAPL Materials, 2022
Perpendicular shape anisotropy (PSA) and double magnetic tunnel junctions (DMTJs) offer practical solutions to downscale spin-transfer-torque Magnetic Random-Access Memory (STT-MRAM) beyond 20 nm technology nodes, while retaining their thermal stability ...
Trevor P. Almeida   +7 more
doaj   +1 more source

Holography with high-power CW coherent terahertz source: optical components, imaging, and applications

open access: yesLight: Advanced Manufacturing, 2022
This paper presents the results of 15 years of studies in the field of terahertz holography at the Novosibirsk free electron laser. They cover two areas: research on obtaining holographic images in the terahertz range and the use of diffractive optical ...
Yulia Choporova   +2 more
doaj   +1 more source

Highly spatially resolved mapping of the piezoelectric potentials in InGaN quantum well structures by off-axis electron holography

open access: yes, 2020
International audienceThe internal fields in 2.2 nm thick InGaN quantum wells in a GaN LED structure have been investigated by using aberration-corrected off-axis electron holography with a spatial resolution of better than 1 nm.
Boureau, V.   +3 more
core   +1 more source

Electrostatic charging artefacts in Lorentz electron tomography of MFM tip stray fields [PDF]

open access: yes, 2001
Using the technique of differential phase contrast (DPC) Lorentz electron microscopy, the magnetic stray field distribution from magnetic force microscopy (MFM) tips can be calculated in a plane in front of the tip using tomographic reconstruction ...
Scott, J.   +3 more
core   +1 more source

Towards electron holography of working transistors [PDF]

open access: yes, 2012
As semiconductor device dimensions are reduced to the deep sub-micron regime, minor departures from the designed distributions of electrostatic potentials can affect device performance dramatically.
Yazdi, Sadegh
core   +2 more sources

Electron Holography Image Simulation of Nanoparticles [PDF]

open access: yes, 2006
We discuss a real-space and a Fourier-space technique to compute numerically, the phase images observed by electron holography of nanoscale particles. An assessment of the applicability and accuracy of these techniques is made by calculating numerical ...
Keimpema, K.   +2 more
core   +4 more sources

Determination of the internal piezoelectric potentials and indium concentration in InGaN based quantum wells grown on relaxed InGaN pseudo-substrates by off-axis electron holography

open access: yes, 2020
International audienceMicro light emitting diodes have been grown by metal organic vapor phase epitaxy on standard GaN and partly relaxed InGaNOS substrates with the purpose of incorporating higher concentrations of indium for identical growth conditions.
Boureau, V   +4 more
core   +1 more source

Transpyrenean Encounter on Advanced Materials

open access: yesMaterials and Devices, 2017
TEAM1 has taken place in Sete (France) on 4, 5, 6 july 2017. It has gathered a little less than 40 participants who presented communications on various fields of advanced materials, and on experimental facilities or experimental methods, that are briefly
Pierre Saint-Grégoire
doaj   +1 more source

Magnetic induction mapping of magnetite chains in magnetotactic bacteria at room temperature and close to the Verwey transition using electron holography

open access: yes, 2005
Off-axis electron holography in the transmission electron microscope is used to record magnetic induction maps of closely spaced magnetite crystals in magnetotactic bacteria at room temperature and after cooling the sample using liquid nitrogen.
Harrison, R. J.   +5 more
core   +1 more source

Wave-front phase retrieval in transmission electron microscopy via ptychography

open access: yes, 2010
There are many different strategies that allow the solving of the well-known phase problem corresponding to the loss of phase information during a physical measurement. In microscopy, and, in particular, in transmission electron microscopy, most of these
Maiden, A.   +9 more
core   +1 more source

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