Electrostatic force microscopy for the accurate characterization of interphases in nanocomposites [PDF]
Beilstein Journal of Nanotechnology, 2018 The unusual properties of nanocomposites are commonly explained by the structure of their interphase. Therefore, these nanoscale interphase regions need to be precisely characterized; however, the existing high resolution experimental methods have not ...
Diana El Khoury +5 more
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Time-dependent measurement of plasmon-induced charge separation on a gold nanoparticle/TiO2 interface by electrostatic force microscopy [PDF]
Scientific Reports, 2022 Plasmon-induced charge separation (PICS) is an efficient way to use the hot carriers generated by localized surface plasmon resonance. Although the ultrafast dynamics of hot carrier generation and annihilation itself are well understood, the slow ...
Tomoki Misaka +2 more
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Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements [PDF]
Beilstein Journal of Nanotechnology, 2019 Recently, there have been a number of variations of electrostatic force microscopy (EFM) that allow for the measurement of time-varying forces arising from phenomena such as ion transport in battery materials or charge separation in photovoltaic systems.
Aaron Mascaro +4 more
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Nanoscale capacitance spectroscopy based on multifrequency electrostatic force microscopy [PDF]
Beilstein Journal of NanotechnologyWe present multifrequency heterodyne electrostatic force microscopy (MFH-EFM) as a novel electrostatic force microscopy method for nanoscale capacitance characterization at arbitrary frequencies above the second cantilever resonance.
Pascal N. Rohrbeck +5 more
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Creation of Optimal Frequency for Electrostatic Force Microscopy Using Direct Digital Synthesizer [PDF]
Applied Sciences, 2017 Electrostatic force microscopy (EFM) is a useful technique when measuring the surface electric potential of a substrate regardless of its topography. Here, we have developed a frequency detection method for alternating current (AC) bias in EFM.
Seunghyun Moon +4 more
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Quantitative electrostatic force measurement and characterization based on oscillation amplitude using atomic force microscopy [PDF]
AIP Advances, 2020 Measurement of electrostatic force at the micro-/nanoscale has a great scientific value and engineering significance. This paper develops a new determination method of electrostatic forces based on Kelvin probe force mode in atomic force microscopy (AFM).
Kesheng Wang +4 more
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Distance and relative humidity contributions to the atomic force microscopy off surface electrostatic response of soda lime glass [PDF]
Scientific ReportsPiezoresponse force microscopy (PFM) has emerged as a tool of choice to probe ferroelectric materials through electrochemomechanical coupling at the nanoscale. However, this technique is not without its challenges, with artefacts related to electrostatic
Iaroslav Gaponenko +4 more
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Probing the surface electrical properties of clay minerals with electrostatic force microscopy and kelvin probe force microscopy [PDF]
Materials Research ExpressMany surface processes of clay minerals require in-depth understanding of their surface electrical properties, such as surface charge density, surface potential distribution, etc In this paper, electrostatic force microscopy (EFM) and Kelvin probe force ...
Zonghua Qin +6 more
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Charge Characterization Of An Electrically Charged Fiber Via Electrostatic Force Microscopy [PDF]
Journal of Engineered Fibers and Fabrics, 2006 The charge of a corona charged electret fiber as well as an uncharged glass fiber was characterized via Electrostatic Force Microscopy (EFM). Electrostatic force gradient images were obtained by monitoring the shifts in phase between the oscillations of ...
Juan P. Hinestroza +2 more
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Nanodielectric mapping of a model polystyrene-poly(vinyl acetate) blend by electrostatic force microscopy [PDF]
, 2010 We present a simple method to quantitatively image the dielectric permittivity of soft materials at nanoscale using electrostatic force microscopy (EFM) by means of the double pass method. The EFM experiments are based on the measurement of the frequency
Clément Riedel +6 more
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