Results 131 to 140 of about 55,978 (270)
Mid-Infrared (MIR) Complex Refractive Index Spectra of Polycrystalline Copper-Nitride Films by IR-VASE Ellipsometry and Their FIB-SEM Porosity [PDF]
E. Márquez +8 more
openalex +1 more source
A novel ellipsometry platform functionalized with truncated PD‐L1 aptamers are developed to enable ultrasensitive detection of BALF‐derived exosomes. Through chemical ligand tailoring, mechanical sensing optimization, and tumor‐proximal fluid sampling, the system precisely stratifies ICI responders and non‐responders, offering superior sensitivity and ...
Euna Jeong +15 more
wiley +1 more source
Surface‐Decoupled Altitudinal and Azimuthal Triptycene‐Fused Tetrapodal Molecular Motors
Two tetrapodal triptycene‐based light‐driven molecular motors with precisely oriented rotation axes—parallel or perpendicular to a gold surface—achieve full 360° rotation in both solution and as monolayers. The design minimizes surface quenching, enabling functional integration into surface‐mounted nanomachines.
Kateřina Bezděková +8 more
wiley +2 more sources
Optical sol-gel coatings : ellipsometry of film formation
Alan J. Hurd, C. Jeffrey Brinker
openalex +2 more sources
Enhancing Electrical and Interfacial Properties of BeO/4H‐SiC Structures with SiO2 Interlayer
The integration of a SiO2 interlayer into the BeO/4H‐SiC stack effectively suppresses carbon‐induced interfacial defects during post‐deposition annealing. This achieves significantly lower interface trap densities and enhanced dielectric strength. Electrical measurements and band‐offset analysis confirm improved carrier confinement, demonstrating the ...
Sangoh Han +7 more
wiley +1 more source
80% Fill Factor in Organic Solar Cells with a Modified Nickel Oxide Interlayer
This work highlights the potential of nickel oxide as a hole transport material for organic solar cells. By studying its defect chemistry and applying surface coordination with carbazole‐based phosphonic acid molecules, the solar cell performance is improved.
David Garcia Romero +9 more
wiley +1 more source
Quantification of microstructural evolution in sputtered a-Si thin films by real time spectroscopic ellipsometry [PDF]
Ilsin An +3 more
openalex +1 more source
Exciton diffusion length in organic semiconductor films is determined from encounter/annihilation rates. Non‐normalized exciton densities and proper intrinsic lifetime reference avoid over‐parametrization of the fits. Monte Carlo Simulation of individual molecule‐to‐molecule hops reproduce these results (②) when matching lattice constant and hoping ...
Wenchao Yang +12 more
wiley +1 more source

