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Application of Spectroscopic Ellipsometry and Mueller Ellipsometry to Optical Characterization
Applied Spectroscopy, 2013Enric GarcĂa-Caurel
exaly
Summaries of Papers Presented at the Quantum Electronics and Laser Science Conference, 2003
K.C. Toussaint +4 more
openaire +1 more source
K.C. Toussaint +4 more
openaire +1 more source

